型号: | SN54HC259FK-00 |
厂商: | TEXAS INSTRUMENTS INC |
元件分类: | 锁存器 |
英文描述: | HC/UH SERIES, LOW LEVEL TRIGGERED D LATCH, TRUE OUTPUT, CQCC20 |
文件页数: | 1/5页 |
文件大小: | 120K |
代理商: | SN54HC259FK-00 |
相关PDF资料 |
PDF描述 |
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SN54HC266J-00 | HC/UH SERIES, QUAD 2-INPUT XNOR GATE, CDIP14 |
SN74HC266DR-00 | HC/UH SERIES, QUAD 2-INPUT XNOR GATE, PDSO14 |
SN54HC266FK-00 | HC/UH SERIES, QUAD 2-INPUT XNOR GATE, CQCC20 |
SNJ54HC266J-00 | HC/UH SERIES, QUAD 2-INPUT XNOR GATE, CDIP14 |
SN54HC273FK | HC/UH SERIES, POSITIVE EDGE TRIGGERED D FLIP-FLOP, TRUE OUTPUT, CQCC20 |
相关代理商/技术参数 |
参数描述 |
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SN54HC259J | 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Texas Instruments 功能描述:LATCH ADDRESSABLE 8CH D-TYPE 16CDIP - Rail/Tube |
SN54HC273J | 制造商:Texas Instruments 功能描述:Flip Flop D-Type Bus Interface Pos-Edge 1-Element 20-Pin CDIP Tube 制造商:Texas Instruments 功能描述:FLIP FLOP D-TYPE BUS INTRFC POS-EDGE 1-ELEM 20CDIP - Rail/Tube 制造商:Texas Instruments 功能描述:OCTAL D-TYPE FLIP-FLOPS WITH CLEAR |
SN54HC273VTDG1 | 制造商:Texas Instruments 功能描述:IC OCT D FLIP-FLOP DIE 制造商:Texas Instruments 功能描述:25degree C Sawn Tested Die 100pct probe |
SN54HC273VTDG2 | 制造商:Texas Instruments 功能描述:IC OCT D FLIP-FLOP DIE 制造商:Texas Instruments 功能描述:25degree C Sawn Tested Die 100pct probe |
SN54HC27J | 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Texas Instruments 功能描述: 制造商:Texas Instruments 功能描述:TRIPLE 3-INPUT NOR GATE - Rail/Tube 制造商:Texas Instruments 功能描述:NOR Gate 3-Element 3-IN CMOS 14-Pin CDIP Tube |