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| 型号： | SN54LVTH18646AHV |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | Octal 3-State Noninverting Buffer/Line Driver/Line Receiver; Package: SOEIAJ-20; No of Pins: 20; Container: Tape and Reel; Qty per Container: 2000 |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与18位收发器和寄存器 |
| 文件页数： | 12/36页 |
| 文件大小： | 551K |
| 代理商： | SN54LVTH18646AHV |
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SN54LVTH18646A, SN54LVTH182646A, SN74LVTH18646A, SN74LVTH182646A
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT TRANSCEIVERS AND REGISTERS
SCBS311D – MARCH 1994 – REVISED JUNE 1997
12
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
boundary-control register
The boundary-control register (BCR) is three bits long. The BCR is used in the context of the RUNT instruction
to implement additional test operations not included in the basic SCOPE instruction set. Such operations include
PRPG, PSA, and binary count up (COUNT). Table 4 shows the test operations that are decoded by the BCR.
During Capture-DR, the contents of the BCR are not changed. At power up or in Test-Logic-Reset, the BCR is
reset to the binary value 010, which selects the PSA test operation. The boundary-control register order of scan
is shown in Figure 4.
Bit 0
(LSB)
TDO
TDI
Bit 1
Bit 2
(MSB)
Figure 4. Boundary-Control Register Order of Scan
bypass register
The bypass register is a 1-bit scan path that can be selected to shorten the length of the system scan path,
reducing the number of bits per test pattern that must be applied to complete a test operation. During
Capture-DR, the bypass register captures a logic 0. The bypass register order of scan is shown in Figure 5.
Bit 0
TDO
TDI
Figure 5. Bypass Register Order of Scan
相关PDF资料 |
PDF描述 |
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| SN54LVTH182652AHV | Octal 3-State Noninverting Buffer/Line Driver/Line Receiver; Package: TSSOP 20 LEAD; No of Pins: 20; Container: Tape and Reel; Qty per Container: 2500 |
| SN54LVTH18652AHV | Octal 3-State Noninverting Buffer/Line Driver/Line Receiver; Package: 20 LEAD PDIP; No of Pins: 20; Container: Rail; Qty per Container: 18 |
| SN54LVTH18512 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
| SN54LVTH182512 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
| SN54LVTH18514 | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器)) |
相关代理商/技术参数 |
参数描述 |
|---|---|
| SN54S00J | 制造商:Texas Instruments 功能描述:NAND Gate 4-Element 2-IN Bipolar 14-Pin CDIP Tube 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| SN54S00W | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| SN54S02J | 制造商:Texas Instruments 功能描述: |
| SN54S03J | 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Texas Instruments 功能描述:2-INPUT NAND GATE (OC) - Rail/Tube |
| SN54S04J | 制造商:Texas Instruments 功能描述:Inverter 6-Element Bipolar 14-Pin CDIP Tube 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Texas Instruments 功能描述:INVERTER 6-ELEM BIPOLAR 14CDIP - Rail/Tube 制造商:Texas Instruments 功能描述:HEX INVERTER *NIC* |
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