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| 型号： | SN54LVTH18652A |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 扫描检测装置(18位收发器和寄存器)) |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与18位收发器和寄存器（3.3 ABT生根粉扫描检测装置（18位收发器和寄存器）） |
| 文件页数： | 3/36页 |
| 文件大小： | 833K |
| 代理商： | SN54LVTH18652A |
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SN54LVTH18652A, SN54LVTH182652A, SN74LVTH18652A, SN74LVTH182652A
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT TRANSCEIVERS AND REGISTERS
SCBS312C – MARCH 1994 – REVISED JUNE 1997
3
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
18 19
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
20
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
21 22 23 24
63 62 61 60 59
64
58
56 55 54
57
25 26 27 28 29
53 52
17
51 50 49
30 31 32
1
G
1
T
1
1
1
V
1
1
1
1
T
1
G
1
2
G
2
2
2
2
2
T
2
2
2
2
V
T
G
2
1A3
1A4
1A5
GND
1A6
1A7
1A8
1A9
V
CC
2A1
2A2
2A3
GND
2A4
2A5
2A6
1B4
1B5
1B6
GND
1B7
1B8
1B9
V
CC
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
C
SN74LVTH18652A, SN74LVTH182652A . . . PM PACKAGE
(TOP VIEW)
FUNCTION TABLE
(normal mode, each 9-bit section)
INPUTS
DATA I/O
OPERATION OR FUNCTION
OEAB
OEBA
CLKAB
CLKBA
SAB
SBA
A1–A9
B1–B9
L
H
L
↑
↑
↑
L
↑
X
L
↑
L
↑
↑
↑
X
X
X
Input disabled
Input disabled
Isolation
L
H
X
X
Input
Input
Store A and B data
X
H
X
X
X
Input
Unspecified
Store A, hold B
H
H
X
Input
Output
Store A in both registers
L
X
X
X
X
Unspecified
Input
Hold A, store B
L
L
X
Output
Input
Store B in both registers
L
L
X
L
Output
Input
Real-time B data to A bus
L
L
X
X
X
H
Output
Input
Stored B data to A bus
H
H
X
X
L
X
Input
Output
Real-time A data to B bus
H
H
X
X
H
X
Input
Output
Stored A data to B bus
H
L
X
X
H
H
Output
Output
Stored A data to B bus and
stored B data to A bus
The data-output functions can be enabled or disabled by a variety of level combinations at OEAB or OEBA. Data-input functions are always
enabled; i.e., data at the bus terminals is stored on every low-to-high transition of the clock inputs.
Select control = L: clocks can occur simultaneously.
Select control = H: clocks must be staggered to load both registers.
相关PDF资料 |
PDF描述 |
|---|---|
| SN54LVTH182652A | 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 扫描检测装置(18位收发器和寄存器)) |
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| SN54LVTH2245J | Octal 3-State Non-Inverting Transparent Latch; Package: TSSOP 20 LEAD; No of Pins: 20; Container: Rail; Qty per Container: 75 |
| SN54LVTH2245W | Octal 3-State Non-Inverting Transparent Latch; Package: TSSOP 20 LEAD; No of Pins: 20; Container: Tape and Reel; Qty per Container: 2500 |
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