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参数资料
| 型号： | SN74ACTQ573QSC |
| 厂商： | FAIRCHILD SEMICONDUCTOR CORP |
| 元件分类： | 总线收发器 |
| 英文描述： | ACT SERIES, 8-BIT DRIVER, TRUE OUTPUT, PDSO20 |
| 封装： | 0.150 INCH, PLASTIC, SSOP-20 |
| 文件页数： | 8/10页 |
| 文件大小： | 212K |
| 代理商： | SN74ACTQ573QSC |
FACT Noise Characteristics (Continued)
V
OLP/VOLV and VOHP/VOHV:
Determine the quiet output pin that demonstrates the
greatest noise levels. The worst case pin will usually be
the furthest from the ground pin. Monitor the output volt-
ages using a 50
coaxial cable plugged into a standard
SMB type connector on the test fixture. Do not use an ac-
tive FET probe.
Measure V
OLP and VOLV on the quiet output durnig the
worst case transition for active and enable. Measure
V
OHP and VOHV on the quiet output during the worst case
active and enable transition.
Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
V
ILD and VIHD:
Monitor one of the switching outputs using a 50
coaxial
cable plugged into a standard SMB type connector on the
test fixture. Do not use an active FET probe.
First increase the input LOW voltage level, V
IL, until the
output begins to oscillate or steps out a min of 2 ns. Os-
cillation is defined as noise on the output LOW level that
exceeds V
IL limits, or on output HIGH levels that exceed
V
IH limits. The input LOW voltage level at which oscilla-
tion occurs is defined as V
ILD.
Next decrease the input HIGH voltage level, V
IH, until the
output begins to oscillate or steps out a min of 2 ns. Os-
cillation is defined as noise on the output LOW level that
exceeds V
IL limits, or on output HIGH levels that exceed
V
IH limits. The input HIGH voltage level at which oscilla-
tion occurs is defined as V
IHD.
Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
DS010633-6
Note 19: VOHV and VOLP are measured with respect to ground reference.
Note 20: Input pulses have the following characteristics: f = 1 MHz,tr = 3 ns,
tf = 3 ns, skew < 150 ps.
FIGURE 1. Quiet Output Noise Voltage Waveforms
DS010633-7
FIGURE 2. Simultaneous Switching Test Circuit
7
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| SN74AHC00D | 功能描述:逻辑门 Quad 2 Input RoHS:否 制造商:Texas Instruments 产品:OR 逻辑系列:LVC 栅极数量:2 线路数量（输入/输出）:2 / 1 高电平输出电流:- 16 mA 低电平输出电流:16 mA 传播延迟时间:3.8 ns 电源电压-最大:5.5 V 电源电压-最小:1.65 V 最大工作温度:+ 125 C 安装风格:SMD/SMT 封装 / 箱体:DCU-8 封装:Reel |
| SN74AHC00DBR | 功能描述:逻辑门 Quad 2-In Pos NAND RoHS:否 制造商:Texas Instruments 产品:OR 逻辑系列:LVC 栅极数量:2 线路数量（输入/输出）:2 / 1 高电平输出电流:- 16 mA 低电平输出电流:16 mA 传播延迟时间:3.8 ns 电源电压-最大:5.5 V 电源电压-最小:1.65 V 最大工作温度:+ 125 C 安装风格:SMD/SMT 封装 / 箱体:DCU-8 封装:Reel |
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| SN74AHC00DBRG4 | 功能描述:逻辑门 Quad 2 Input Pos NAND Gates RoHS:否 制造商:Texas Instruments 产品:OR 逻辑系列:LVC 栅极数量:2 线路数量（输入/输出）:2 / 1 高电平输出电流:- 16 mA 低电平输出电流:16 mA 传播延迟时间:3.8 ns 电源电压-最大:5.5 V 电源电压-最小:1.65 V 最大工作温度:+ 125 C 安装风格:SMD/SMT 封装 / 箱体:DCU-8 封装:Reel |
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