参数资料
型号: SN74LVTH18245
厂商: Texas Instruments, Inc.
英文描述: 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器)
中文描述: 的3.3V ABT生根粉扫描测试设备与18位通用总线收发器(3.3V的ABT生根粉扫描检测装置带18位总线收发器)
文件页数: 33/34页
文件大小: 706K
代理商: SN74LVTH18245
SN54LVTH18245, SN54LVTH182245, SN74LVTH18245, SN74LVTH182245
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT BUS TRANSCEIVERS
SCBS161C – AUGUST 1993 – REVISED JULY 1996
33
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
1.5 V
th
tsu
From Output
Under Test
CL = 50 pF
(see Note A)
LOAD CIRCUIT
S1
6 V
Open
GND
500
500
Data Input
Timing Input
1.5 V
2.7 V
0 V
1.5 V
1.5 V
2.7 V
0 V
2.7 V
0 V
1.5 V
1.5 V
tw
Input
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
INVERTING AND NONINVERTING OUTPUTS
VOLTAGE WAVEFORMS
PULSE DURATION
tPLH
tPHL
tPHL
tPLH
VOH
VOH
VOL
VOL
1.5 V
1.5 V
2.7 V
0 V
1.5 V
1.5 V
Input
1.5 V
Output
Control
Output
Waveform 1
S1 at 6 V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
VOL
VOH
tPZL
tPZH
tPLZ
tPHZ
1.5 V
1.5 V
3 V
0 V
1.5 V
VOL + 0.3 V
1.5 V
VOH – 0.3 V
0 V
2.7 V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
Output
Output
tPLH/tPHL
tPLZ/tPZL
tPHZ/tPZH
Open
6 V
GND
TEST
S1
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR
10 MHz, ZO = 50
, tr
2.5 ns, tf
2.5 ns.
D. The outputs are measured one at a time with one transition per measurement.
Figure 14. Load Circuit and Voltage Waveforms
P
相关PDF资料
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