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| 型号： | SN74LVTH182640 |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器)) |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与18位反相总线收发器（3.3V的ABT生根粉扫描检测装置（18位反相总线收发器）） |
| 文件页数： | 24/34页 |
| 文件大小： | 707K |
| 代理商： | SN74LVTH182640 |
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SN54LVTH18640, SN54LVTH182640, SN74LVTH18640, SN74LVTH182640
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT INVERTING BUS TRANSCEIVERS
SCBS310C – MARCH 1994 – REVISED DECEMBER 1996
24
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
E
E
T
1
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R
S
S
C
S
U
S
C
S
U
S
S
T
TCK
TMS
TDI
TDO
TAP
Controller
State
3-State (TDO) or Don’t Care (TDI)
Figure 13. Timing Example
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
CC
Input voltage range, V
I
(see Note 1)
Voltage range applied to any output in the high state or power-off state, V
O
(see Note 1)
Current into any output in the low state, I
O
: SN54LVTH18640
SN54LVTH182640 (A port or TDO)
SN54LVTH182640 (B port)
SN74LVTH18640
SN74LVTH182640 (A port or TDO)
SN74LVTH182640 (B port)
Current into any output in the high state, I
O
(see Note 2): SN54LVTH18640
–0.5 V to 4.6 V
–0.5 V to 7 V
–0.5 V to 7 V
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96 mA
96 mA
30 mA
128 mA
128 mA
30 mA
48 mA
48 mA
30 mA
64 mA
64 mA
30 mA
–50 mA
–50 mA
1 W
1.4 W
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SN54LVTH182640 (A port or TDO)
SN54LVTH182640 (B port)
SN74LVTH18640
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SN74LVTH182640 (A port or TDO)
SN74LVTH182640 (B port)
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Input clamp current, I
IK
(V
I
< 0)
Output clamp current, I
OK
(V
O
< 0)
Maximum power dissipation at T
A
= 55
°
C (in still air) (see Note 3):DGG package
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DL package
Storage temperature range, T
stg
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings can be exceeded if the input and output clamp-current ratings are observed.
2. This current will only flow when the output is in the high state and VO > VCC.
3. The maximum package power dissipation is calculated using a junction temperature of 150 C and a board trace length of 750 mils.
For more information, refer to the Package Thermal Considerationsapplication note in the ABT Advanced BiCMOS Technology Data
Book, iterature number SCBD002.
–65
°
C to 150
°
C
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P
相关PDF资料 |
PDF描述 |
|---|---|
| SN74LVTH18640 | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器)) |
| SN54LVTH18646A | 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 扫描检测装置(18位收发器和寄存器)) |
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| SN54LVTH18652A | 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 扫描检测装置(18位收发器和寄存器)) |
| SN54LVTH182652A | 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 扫描检测装置(18位收发器和寄存器)) |
相关代理商/技术参数 |
参数描述 |
|---|---|
| SN74LVTH182646APM | 功能描述:特定功能逻辑 18bit ABT 3.3V RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74LVTH182652APM | 功能描述:特定功能逻辑 10-Bit Bus Interface F-F W/3-State Otpt RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74LVTH18502APM | 功能描述:特定功能逻辑 3.3-V ABT w/18-Bit Univ Bus Transceiver RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74LVTH18502APMG4 | 功能描述:特定功能逻辑 3.3-V ABT w/18-Bit Univ Bus Transceiver RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74LVTH18502APMR | 功能描述:特定功能逻辑 10-Bit Bus/MOS Mem Drv RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
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