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参数资料
| 型号： | SNJ54AC86W |
| 厂商： | TEXAS INSTRUMENTS INC |
| 元件分类： | 门电路 |
| 英文描述： | AC SERIES, QUAD 2-INPUT XOR GATE, CDFP14 |
| 封装： | CERAMIC, DFP-14 |
| 文件页数： | 14/20页 |
| 文件大小： | 800K |
| 代理商： | SNJ54AC86W |
SN54AC86, SN74AC86
QUADRUPLE 2INPUT EXCLUSIVEOR GATES
SCAS533C AUGUST 1995 REVISED OCTOBER 2003
3
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
recommended operating conditions (see Note 3)
SN54AC86
SN74AC86
UNIT
MIN
MAX
MIN
MAX
UNIT
VCC
Supply voltage
2
6
2
6
V
VCC = 3 V
2.1
VIH
High-level input voltage
VCC = 4.5 V
3.15
V
VIH
High-level input voltage
VCC = 5.5 V
3.85
V
VCC = 3 V
0.9
VIL
Low-level input voltage
VCC = 4.5 V
1.35
V
VIL
Low-level input voltage
VCC = 5.5 V
1.65
V
VI
Input voltage
0
VCC
0
VCC
V
VO
Output voltage
0
VCC
0
VCC
V
VCC = 3 V
12
IOH
High-level output current
VCC = 4.5 V
24
mA
IOH
High-level output current
VCC = 5.5 V
24
mA
VCC = 3 V
12
IOL
Low-level output current
VCC = 4.5 V
24
mA
IOL
Low-level output current
VCC = 5.5 V
24
mA
t/v
Input transition rise or fall rate
8
ns/V
TA
Operating free-air temperature
55
125
40
85
°C
NOTE 3: All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
VCC
TA = 25°C
SN54AC86
SN74AC86
UNIT
PARAMETER
TEST CONDITIONS
VCC
MIN
TYP
MAX
MIN
MAX
MIN
MAX
UNIT
3 V
2.9
IOH = 50 A
4.5 V
4.4
IOH = 50 A
5.5 V
5.4
VOH
IOH = 12 mA
3 V
2.56
2.4
2.46
V
VOH
IOH = 24 mA
4.5 V
3.86
3.7
3.76
V
IOH = 24 mA
5.5 V
4.86
4.7
4.76
IOH = 50 mA
5.5 V
3.85
IOH = 75 mA
5.5 V
3.85
3 V
0.002
0.1
IOL = 50 A
4.5 V
0.001
0.1
IOL = 50 A
5.5 V
0.001
0.1
VOL
IOL = 12 mA
3 V
0.36
0.5
0.44
V
VOL
IOL = 24 mA
4.5 V
0.36
0.5
0.44
V
IOL = 24 mA
5.5 V
0.36
0.5
0.44
IOL = 50 mA
5.5 V
1.65
IOL = 75 mA
5.5 V
1.65
II
VI = VCC or GND
5.5 V
±0.1
±1
A
ICC
VI = VCC or GND,
IO = 0
5.5 V
2
40
20
A
Ci
VI = VCC or GND
5 V
2.6
pF
Not more than one output should be tested at a time, and the duration of the test should not exceed 10 ms.
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