参数资料
型号: SP211EHCA-L/TR
厂商: Exar Corporation
文件页数: 3/16页
文件大小: 0K
描述: IC TXRX RS232 MULTI-CH 28SSOP
标准包装: 1,500
类型: 收发器
驱动器/接收器数: 4/5
规程: RS232
电源电压: 4.5 V ~ 5.5 V
安装类型: 表面贴装
封装/外壳: 28-SSOP(0.209",5.30mm 宽)
供应商设备封装: 28-SSOP
包装: 带卷 (TR)
Exar Corporation 48720 Kato Road, Fremont CA, 94538 50-668-707 www.exar.com
SP2EH_23EH_0_060
RS and RV add up to 330 for IEC61000-4-2.
RC
Device
Under
Test
DC Power
Source
CS
RS
SW1
SW2
RV
Contact-Discharge Model
Figure . ESD Test Circuit for IEC6000-4-2
Figure12.ESDTestWaveformforIEC61000-4-2
The Contact Discharge Method applies the
ESDcurrentdirectlytotheEUT.Thismethod
was devised to reduce the unpredictability
of the ESD arc. The discharge current rise
time is constant since the energy is directly
transferred without the air-gap arc. In situa-
tions such as hand held systems, the ESD
charge can be directly discharged to the
equipment from a person already holding
the equipment. The current is transferred
on to the keypad or the serial port of the
equipment directly and then travels through
thePCBandfinallytotheIC.
The circuit model in Figures 0 and repre-
sent the typical ESD testing circuit used for
all three methods. The C
S is initially charged
with the DC power supply when the first
switch(SW1)ison.Nowthatthecapacitor
ischarged,thesecondswitch(SW2)ison
whileSW1switchesoff.Thevoltagestored
in the capacitor is then applied through R
S,
the current limiting resistor, onto the device
undertest(DUT).InESDtests,theSW2
switch is pulsed so that the device under
test receives a duration of voltage.
For the Human Body Model, the current
limitingresistor(R
S) and the source capacitor
(C
S)are1.5kΩan100pF,respectively.For
IEC-6000-4-2, the current limiting resistor
(R
S) and the source capacitor (CS)are330Ω
an 50pF, respectively.
The higher C
S value and lower RS value in
the IEC6000-4-2 model are more stringent
than the Human Body Model. The larger
storage capacitor injects a higher voltage
tothetestpointwhenSW2isswitchedon.
The lower current limiting resistor increases
the current charge onto the test point.
t=0ns
t=30ns
0A
5A
30A
t
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