参数资料
型号: SPC560B50L3C5E0Y
厂商: STMICROELECTRONICS
元件分类: 微控制器/微处理器
英文描述: 32-BIT, FLASH, 64 MHz, MICROCONTROLLER, PQFP100
封装: 14 X 14 MM, 1.40 MM HEIGHT, ROHS COMPLIANT, LQFP-100
文件页数: 7/74页
文件大小: 971K
代理商: SPC560B50L3C5E0Y
Electrical characteristics
SPC560Bx, SPC560Cx
Doc ID 14619 Rev 4
4
Electrical characteristics
4.1
Introduction
This section contains electrical characteristics of the device as well as temperature and
power considerations.
This product contains devices to protect the inputs against damage due to high static
voltages. However, it is advisable to take precautions to avoid application of any voltage
higher than the specified maximum rated voltages.
To enhance reliability, unused inputs can be driven to an appropriate logic voltage level (VDD
or VSS). This could be done by the internal pull-up and pull-down, which is provided by the
product for most general purpose pins.
The parameters listed in the following tables represent the characteristics of the device and
its demands on the system.
In the tables where the device logic provides signals with their respective timing
characteristics, the symbol “CC” for Controller Characteristics is included in the Symbol
column.
In the tables where the external system must provide signals with their respective timing
characteristics to the device, the symbol “SR” for System Requirement is included in the
Symbol column.
Caution:
All of the following figures are indicative and must be confirmed during either silicon
validation, silicon characterization or silicon reliability trial.
4.2
Parameter classification
The electrical parameters shown in this supplement are guaranteed by various methods. To
give the customer a better understanding, the classifications listed in Table 4 are used and
the parameters are tagged accordingly in the tables where appropriate.
Note:
The classification is shown in the column labeled “C” in the parameter tables where
appropriate.
Table 4.
Parameter classifications
Classification tag
Tag description
P
Those parameters are guaranteed during production testing on each individual device.
C
Those parameters are achieved by the design characterization by measuring a statistically
relevant sample size across process variations.
T
Those parameters are achieved by design characterization on a small sample size from typical
devices under typical conditions unless otherwise noted. All values shown in the typical
column are within this category.
D
Those parameters are derived mainly from simulations.
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