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参数资料
| 型号： | SPT574CCN |
| 厂商： | SIGNAL PROCESSING TECHNOLOGIES |
| 元件分类： | ADC |
| 英文描述： | 1-CH 12-BIT SUCCESSIVE APPROXIMATION ADC, PARALLEL ACCESS, PDIP28 |
| 封装： | PLASTIC, DIP-28 |
| 文件页数： | 8/12页 |
| 文件大小： | 113K |
| 代理商： | SPT574CCN |
SPT
5
8/1/00
SPT574
ELECTRICAL SPECIFICATIONS
TA = TMIN to TMAX, VEE = 0 to +5 V, VDD = +5 V, fS = 40 kHz, fIN = 10 kHz, unless otherwise specified.
TEST
SPT574C
SPT574B
PARAMETER
CONDITIONS
LEVEL
MIN
TYP
MAX
MIN
TYP
MAX
UNITS
AC ELECTRICAL CHARACTERISTICS4
Stand-Alone Mode Timing
tHRL Low R/C Pulse Width
VI
25
ns
tDS STS Delay from R/C
VI
200
ns
tHDR Data Valid After R/C Low
VI
25
ns
tHS STS Delay After Data Valid
VI
300
400
1000
300
400
1000
ns
tHRH High R/C Pulse Width
VI
100
ns
tDDR Data Access Time
VI
150
ns
Sample-and-Hold
Aperture Delay
VEE = +5 V
IV
20
ns
Aperture Uncertainty Time
VEE = +5 V
V
300
ps, RMS
Figure 4 -
High Pulse for R/C - Outputs Enabled While
R/C is High, Otherwise High Impedance
Figure 3 - Low Pulse for R/C - Outputs Enabled
After Conversion
R/C
t
HRL
DATA VALID
DB11-DB0
STS
t
DS
t
C
t
HDR
t HS
DB11-DB0
t
HRH
STS
t
C
t
DDR
t
DS
t
HDR
DATA VALID
HIGH-Z
R/C
HIGH-Z
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA=25 °C, and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design
and characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at TA = 25 °C. Parameter is
guaranteed over specified temperature range.
TEST LEVEL
I
II
III
IV
V
VI
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