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参数资料
| 型号： | SPT7871SCU |
| 厂商： | SIGNAL PROCESSING TECHNOLOGIES |
| 元件分类： | ADC |
| 英文描述： | 10-BIT, 100 MSPS TTL A/D CONVERTER |
| 中文描述： | 1-CH 10-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, UUC44 |
| 封装： | DIE-44 |
| 文件页数： | 3/8页 |
| 文件大小： | 64K |
| 代理商： | SPT7871SCU |
3
9/7/98
SPT7871
ELECTRICAL SPECIFICATIONS
T
A
= +25
°
C , DV
CC
=AV
CC
= +5.0 V, V
EE
= -5.2 V, V
IN
=
±
1.0 V, f
clock
= 80 MHz, 50% clock duty cycle, unless otherwise specified.
TEST
PARAMETERS
CONDITIONS
Dynamic Performance
Signal-to-Noise + Distortion (SINAD)
f
IN
=10 MHz
f
IN
= 25 MHz
f
IN
= 25 MHz
f
clock
= 100 MHz
f
IN
= 50 MHz
f
IN
= 50 MHz
f
clock
= 100 MHz
Spurious Free Dynamic Range
f
IN
= 10 MHz
f
IN
= 25 MHz
f
IN
= 50 MHz
Two-Tone IMD Rejection
2
Differential Phase
Differential Gain
Power Supply Requirements
AV
CC
Supply Voltage
DV
CC
Supply Voltage
V
EE
Supply Voltage
V
CC
Supply Current
Full Temperature
V
EE
Supply Current
Full Temperature
Power Dissipation
Full Temperature
Power Supply Rejection Ratio
Digital Inputs
LINV, MINV
Clock Inputs
Logic 1 Voltage (ECL)
Logic 0 Voltage (ECL)
Maximum Input Current Low
Maximum Input Current High
Pulse Width Low (CLK)
Pulse Width High (CLK)
Rise/Fall Time
20% to 80%
Digital Outputs
Logic 1 Voltage (TTL)
2 mA
Logic 0 Voltage (TTL)
2 mA
t
Rise
10% to 90%
t
Fall
10% to 90%
1
2048 pt FFT using distortion harmonics 2 through 10.
2
Measured as a second order (f1-f2) intermodulation product from a two-tone test with each input tone at 0 dBm.
TEST
LEVEL
MIN
TYP
MAX
UNITS
I
I
51
51
53
53
50
49
47
dB
dB
dB
dB
dB
V
I
V
47
V
V
V
V
V
V
65
63
52
-65
0.5
dB FS
dB FS
dB FS
dBc
Degree
%
1
IV
IV
IV
VI
VI
VI
IV
4.75
4.75
-4.95
5.0
5.0
-5.2
210
128
1.7
30
5.25
5.25
-5.45
248
151
2.0
V
V
V
mA
mA
W
dB
V
CMOS/TTL
Logic
VI
VI
VI
VI
IV
IV
IV
-1.1
V
V
μ
A
μ
A
ns
ns
ns
-1.5
+100
+100
250
250
1.5
-100
-100
4.0
4.0
VI
VI
V
V
2.4
2.8
0.5
2.0
2.0
V
V
ns
ns
0.8
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
Unless otherwise noted, all tests are pulsed
tests; therefore, T
J
= T
C
= T
A
.
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at T
A
= +25
°
C, and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design
and characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at T
A
= +25
°
C. Parameter is
guaranteed over specified temperature range.
TEST LEVEL
I
II
III
IV
V
VI
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