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| 型号： | STM32F100V6T7BXXX |
| 厂商： | STMICROELECTRONICS |
| 元件分类： | 微控制器/微处理器 |
| 英文描述： | 32-BIT, FLASH, 24 MHz, RISC MICROCONTROLLER, PQFP100 |
| 封装： | 14 X 14 MM, ROHS COMPLIANT, LQFP-100 |
| 文件页数： | 65/86页 |
| 文件大小： | 1198K |
| 代理商： | STM32F100V6T7BXXX |
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Electrical characteristics
STM32F100x4, STM32F100x6, STM32F100x8, STM32F100xB
Doc ID 16455 Rev 3
The above formula (Equation 1) is used to determine the maximum external impedance allowed for an
error below 1/4 of LSB. Here N = 12 (from 12-bit resolution).
Note:
ADC accuracy vs. negative injection current: Injecting a negative current on any of the
standard (non-robust) analog input pins should be avoided as this significantly reduces the
accuracy of the conversion being performed on another analog input. It is recommended to
Table 42.
RAIN max for fADC = 12 MHz
(1)
1.
Guaranteed by design, not tested in production.
Ts (cycles)
tS (s)
RAIN max (k)
1.5
0.125
0.4
7.5
0.625
5.9
13.5
1.125
11.4
28.5
2.375
25.2
41.5
3.45
37.2
55.5
4.625
50
71.5
5.96
NA
239.5
20
NA
Table 43.
ADC accuracy - limited test conditions(1)(2)
1.
ADC DC accuracy values are measured after internal calibration.
2.
Based on characterization, not tested in production.
Symbol
Parameter
Test conditions
Typ
Max
Unit
ET
Total unadjusted error
fPCLK2 = 24 MHz,
fADC = 12 MHz, RAIN < 10 k,
VDDA = 3 V to 3.6 V
VREF+ = VDDA
TA = 25 °C
Measurements made after
ADC calibration
±1.5
±2.5
LSB
EO
Offset error
±1
±2
EG
Gain error
±0.5
±1.5
ED
Differential linearity error
±1.5
±2
EL
Integral linearity error
±1.5
±2
Table 44.
ADC accuracy(1) (2) (3)
1.
ADC DC accuracy values are measured after internal calibration.
2.
Better performance could be achieved in restricted VDD, frequency, VREF and temperature ranges.
3.
Based on characterization, not tested in production.
Symbol
Parameter
Test conditions
Typ
Max
Unit
ET
Total unadjusted error
fPCLK2 = 24 MHz,
fADC = 12 MHz, RAIN < 10 k,
VDDA = 2.4 V to 3.6 V
TA = Full operating range
Measurements made after
ADC calibration
±2
±5
LSB
EO
Offset error
±1.5
±2.5
EG
Gain error
±1.5
±3
ED
Differential linearity error
±1.5
±2.5
EL
Integral linearity error
±1.5
±4.5
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