参数资料
型号: STM32L152C8T6TR
厂商: STMICROELECTRONICS
元件分类: 微控制器/微处理器
英文描述: 32-BIT, FLASH, 32 MHz, RISC MICROCONTROLLER, PQFP48
封装: 7 X 7 MM, 0.50 MM PITCH, ROHS COMPLIANT, LQFP-48
文件页数: 91/106页
文件大小: 1417K
代理商: STM32L152C8T6TR
STM32L151xx, STM32L152xx
Electrical characteristics
Doc ID 17659 Rev 1
Figure 25.
ADC accuracy characteristics
Table 50.
ADC accuracy (1)(2)
1.
Better performance could be achieved in restricted VDD, frequency, VREF and temperature ranges.
2.
ADC Accuracy vs. Negative Injection Current: Injecting negative current on any of the standard (non-
robust) analog input pins should be avoided as this significantly reduces the accuracy of the conversion
being performed on another analog input. It is recommended to add a Schottky diode (pin to ground) to
standard analog pins which may potentially inject negative current.
Any positive injection current within the limits specified for IINJ(PIN) and ΣIINJ(PIN) in Section 6.3.11 does not
affect the ADC accuracy.
Symbol
Parameter
Test conditions
Typ
Max(3)
3.
Based on characterization, not tested in production.
Unit
ET
Total unadjusted error
fPCLK2 = 56 MHz,
fADC = 14 MHz, RAIN < 10 kΩ,
VDDA = 2.4 V to 3.6 V
Measurements made after
ADC calibration
±TBD ±TBD
LSB
EO
Offset error
±TBD ±TBD
EG
Gain error
±TBD ±TBD
ED
Differential linearity error
±TBD ±TBD
EL
Integral linearity error
±TBD ±TBD
ENOB
Effective number of bits
±TBD ±TBD
bits
SINAD
Signal-to-noise and distortion ratio
±TBD ±TBD
dB
SNR
Signal-to-noise ratio
±TBD ±TBD
THD
Total harmonic distortion
±TBD ±TBD
EO
EG
1LSBIDEAL
(1) Example of an actual transfer curve
(2) The ideal transfer curve
(3) End point correlation line
ET=Total Unadjusted Error: maximum deviation
between the actual and the ideal transfer curves.
EO=Offset Error: deviation between the first actual
transition and the first ideal one.
EG=Gain Error: deviation between the last ideal
transition and the last actual one.
ED=Differential Linearity Error: maximum deviation
between actual steps and the ideal one.
EL=Integral Linearity Error: maximum deviation
between any actual transition and the end point
correlation line.
4095
4094
4093
5
4
3
2
1
0
7
6
1
2
3
456
7
4093 4094 4095 4096
(1)
(2)
ET
ED
EL
(3)
VDDA
VSSA
ai14395b
VREF+
4096
(or
depending on package)]
VDDA
4096
[1LSBIDEAL =
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