参数资料
型号: SY89296UMG
厂商: Micrel Inc
文件页数: 17/17页
文件大小: 0K
描述: IC DELAY LINE 1024TAP 32-MLF
标准包装: 60
系列: Precision Edge®
标片/步级数: 1024
功能: 可编程
延迟到第一抽头: 3.2ns
接头增量: 10ps
可用的总延迟: 3.2ns ~ 14.8ns
独立延迟数: 1
电源电压: 2.375 V ~ 3.6 V
工作温度: -40°C ~ 85°C
安装类型: 表面贴装
封装/外壳: 32-VFQFN 裸露焊盘,32-MLF?
供应商设备封装: 32-MLF?(5x5)
包装: 管件
产品目录页面: 1090 (CN2011-ZH PDF)
其它名称: 576-2556
SY89296UMG-ND
Micrel, Inc.
SY89296U
November 2011
9
M9999-112211
hbwhelp@micrel.com or (408) 955-1690
AC Electrical Characteristics
(7) (Continued)
TA = –40°C to +85°C, unless otherwise stated.
Symbol
Parameter
Condition
Min.
Typ.
Max.
Units
Set-Up Time
D t+o LEN
Note 10
200
D to IN
Note 11
350
tS
/EN to IN
300
ps
Hold Time
LEN to D
200
tH
IN to /EN
Note 12
400
ps
Release Time
/EN to IN
500
SETMAX to LEN
500
tR
SETMIN to LEN
450
ps
Cycle-to-Cycle Jitter
Note 13
2
psRMS
Total Jitter
Note 14
10
psPP
tJITTER
Random Jitter
Note 15
1
psRMS
20% to 80% (Q)
50
85
160
ps
tr, tf
Output Rise/Fall Time
20% to 80% (CASCADE)
90
300
ps
Duty Cycle
45
55
%
fT
FTUNE
0
≤ FTUNE ≤ 1.25V
47
52
Ps/V
Notes:
10. This setup time defines the amount of time prior to the input signal. The delay tap of the device must be set.
11. This setup time defines the amount of the time that /EN must be asserted prior to the next transition of IN, /IN to prevent an output response greater
than
±75mV to the IN, /IN transition.
12. Hold time is the minimum time that /EN must remain asserted after a negative going IN or a positive going /IN to prevent an output response
greater than
±75mV to that IN, /IN transition .
13. Cycle-to-cycle jitter definition: the variation of periods between adjacent cycles over a random sample of adjacent cycle pairs
Tjitter_cc = Tn Tn + 1, where T is the time between rising edges of the output signal.
14. Total jitter definition: with an ideal clock input, no more than one output edge in 10
12 output edges will deviate by more than the specified peak-to-
peak jitter value.
15. Random jitter definition: jitter that is characterized by a Gaussian distribution, unbounded and is quantified by its standard deviation and mean.
Random jitter is measured with a K28.7 comma defect pattern, measured at 1.5Gbps.
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