
TA8050P
2005-03-29
4
Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
VCC
30
Supply voltage
VCC
60 (1s)
V
Input voltage
VIN
0.3 to VCC
V
Output current
IO-AVE
1.5
A
Operation temperature
Topr
40 to 110
°C
Storage temperature
Tstg
55 to 150
°C
Power dissipation
PD
12.5
W
Note:
The absolute maximum ratings of a semiconductor device are a set of specified parameter values which
must not be exceeded during operation, even for an instant.
If any of these levels is exceeded during operation, the device’s electrical characteristics may be irreparably
altered and the reliability and lifetime of the device can no longer be guaranteed, possibly causing damage to
any other equipment with which it is used. Applications using the device should be designed such that the
maximum ratings will never be exceeded in any operating conditions.
Ensuring that the parameter values remain within these specified ranges during device operation will help to
ensure that the integrity of the device is not compromised.
Electrical Characteristics (VCC = 6 to 16 V, Tc = 40 to 110°C)
Characteristic
Symbol L
Pin
Test
Circuit
Test Condition
Min
Typ.
Max
Unit
ICC1
Stop
8
15
ICC2
Forward / Reverse
27
50
Current consumption
ICC3
VCC
Brake
16
30
mA
VIL
0.8
Input voltage
VIH
DI1 /
DI2
2.0
V
IIL
VIN = 0.4 V
100
Input current
IIH
DI1 /
DI2
VIN = VCC
100
A
IO = 1.5 A, Tc = 25°C
2.2
2.9
Output saturation voltage
Vsat
(total)
M (+) /
M ()
IO = 1.5 A, Tc = 110°C
2.2
2.8
V
ILEAK-U
VO = 0 V
100
Output leakage current
ILEAK-L
M (+) /
M ()
VO = VCC
100
A
VF-U
2.6
Diodes forward voltage
VF-L
M (+) /
M ()
IF = 1.5 A
1.5
V
Overcurrent detection
ISD
1.8
3
4
A
Shutdown temperature
TSD
150
°C
Overvoltage detection
VSD
25
27.5
30
V
Thermal resistance
Rθj-c
4
°C / W
tpLH
1
10
Transfer delay time
tpHL
1
10
s
Note: The parameter values above are guaranteed in the operating voltage range of 6 V to 16 V. If the guaranteed
range is exceeded, the performance of the IC must be tested thoroughly in its application. It is the customer’s
responsibility to evaluate the use of the IC.