参数资料
型号: TC7117AIPL
元件分类: ADC
英文描述: 1-CH DUAL-SLOPE ADC, PDIP40
封装: PLASTIC, DIP-40
文件页数: 27/32页
文件大小: 515K
代理商: TC7117AIPL
TC7106/A/TC7107/A
DS21455C-page 4
2006 Microchip Technology Inc.
1.0
ELECTRICAL
CHARACTERISTICS
Absolute Maximum Ratings*
TC7106A
Supply Voltage (V+ to V-) .......................................15V
Analog Input Voltage (either Input) (Note 1) ... V+ to V-
Reference Input Voltage (either Input) ............ V+ to V-
Clock Input ................................................... Test to V+
Package Power Dissipation (TA ≤ 70°C) (Note 2):
40-Pin CERDIP .......................................2.29W
40-Pin PDIP ............................................1.23W
44-Pin PLCC ...........................................1.23W
44-Pin PQFP ...........................................1.00W
Operating Temperature Range:
C (Commercial) Devices .............. 0°C to +70°C
I (Industrial) Devices ................ -25°C to +85°C
Storage Temperature Range ..............-65°C to +150°C
TC7107A
Supply Voltage (V+) ...............................................+6V
Supply Voltage (V-)..................................................-9V
Analog Input Voltage (either Input) (Note 1) ... V+ to V-
Reference Input Voltage (either Input) ............ V+ to V-
Clock Input ..................................................GND to V+
Package Power Dissipation (TA ≤ 70°C) (Note 2):
40-Pin CERDip ........................................2.29W
40-Pin PDIP ............................................1.23W
44-Pin PLCC ...........................................1.23W
44-Pin PQFP ...........................................1.00W
Operating Temperature Range:
C (Commercial) Devices .............. 0°C to +70°C
I (Industrial) Devices ................ -25°C to +85°C
Storage Temperature Range ..............-65°C to +150°C
*Stresses
above
those
listed
under
“Absolute
Maximum Ratings” may cause permanent damage to
the device. These are stress ratings only and functional
operation of the device at these or any other conditions
above those indicated in the operation sections of the
specifications is not implied. Exposure to Absolute
Maximum Rating conditions for extended periods may
affect device reliability.
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