参数资料
型号: TC835CKW
元件分类: ADC
英文描述: 1-CH DUAL-SLOPE ADC, PQFP44
封装: PLASTIC, QFP-44
文件页数: 3/24页
文件大小: 543K
代理商: TC835CKW
2002 Microchip Technology Inc.
DS21478B-page 11
TC835
FIGURE 5-2:
TIMING DIAGRAMS FOR
OUTPUTS
5.1
RUN/HOLD Input (Pin 25)
When left open, this pin assumes a logic "1" level. With
a RUN/HOLD = 1, the TC835 performs conversions
continuously, with a new measurement cycle beginning
every 40,002 clock pulses.
When RUN/HOLD changes to a logic "0," the measure-
ment cycle in progress will be completed, and data held
and displayed as long as the logic "0" condition exists.
A positive pulse (>300nsec) at RUN/HOLD initiates a
new measurement cycle. The measurement cycle in
progress when RUN/HOLD initially assumed the logic
"0" state must be completed before the positive pulse
can be recognized as a single conversion run
command.
The new measurement cycle begins with a 10,001-
count auto zero phase. At the end of this phase, the
busy signal goes high.
5.2
STROBE Output (Pin 26)
During the measurement cycle, the STROBE control
line is pulsed low five times. The five low pulses occur
in the center of the digit drive signals (D1,D2,D3,D5)
(see Figure 5-3).
D5 (MSD) goes high for 201 counts when the measure-
ment cycles end. In the center of the D5 pulse, 101
clock pulses after the end of the measurement cycle,
the first STROBE occurs for one-half clock pulse. After
the D
5 digit strobe, D4 goes high for 200 clock pulses.
The STROBE goes low 100 clock pulses after D
4 goes
high. This continues through the D1 digit drive pulse.
The digit drive signals will continue to permit display
scanning. STROBE pulses are not repeated until a new
measurement is completed. The digit drive signals will
not continue if the previous signal resulted in an
overrange condition.
Theactivelow STROBE pulses aid BCD data transfer
to UARTs, processors and external latches.
FIGURE 5-3:
STROBE SIGNAL LOW
FIVE TIMES PER
CONVERSION
5.3
BUSY Output
At the beginning of the signal integration phase, BUSY
goes high and remains high until the first clock pulse
after the integrator zero crossing. BUSY returns to the
logic "0" state after the measurement cycle ends in an
overrange condition. The internal display latches are
loaded during the first clock pulse after BUSY and are
latched at the clock pulse end. The BUSY signal does
not go high at the beginning of the measurement cycle,
which starts with the auto zero cycle.
Integrator
Output
Overrange when
Applicable
Underrange when
Applicable
System
Zero
10,001
Counts
Signal
Integrate
10,000
Counts
(Fixed)
Reference
Integrate
20,001
Counts (Max)
Full Measurement Cycle
40,002 Counts
Busy
Expanded Scale Below
D5
D4
D3
D2
D1
100
Counts
Digit Scan
STROBE
Auto Zero
Signal
Integrate
Reference
Integrate
D5
D4
D3
D2
D1
Digit Scan
for Overrange
First D5 of System Zero and
Reference Integrate One Count
Longer
*
End of Conversion
D5 (MSD)
Data
Busy
B1–B8
STROBE
D5
D4
D3
D2
D1
D4
Data
D3
Data
D2
Data
D1 (LSD)
Data
D5
Data
Note Absence of
STROBE
201
Counts
200
Counts
200
Counts
200
Counts
200
Counts
200
Counts
200
Counts
*
*Delay between Busy going Low and First STROBE pulse is
dependent on Analog Input.
TC835
Outputs
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