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参数资料
| 型号： | TDA1311AT-T |
| 厂商： | NXP SEMICONDUCTORS |
| 元件分类： | DAC |
| 英文描述： | SERIAL INPUT LOADING, 0.2 us SETTLING TIME, 16-BIT DAC, PDSO8 |
| 封装： | PLASTIC, SOP-8 |
| 文件页数： | 17/20页 |
| 文件大小： | 104K |
| 代理商： | TDA1311AT-T |
1995 Dec 18
6
Philips Semiconductors
Preliminary specication
Stereo Continuous Calibration DAC
(CC-DAC)
TDA1311A
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134).
Note
1. Human body model: C = 100 pF, R = 1500
, 3 pulses positive and 3 pulses negative.
2. Machine model: C = 200 pF, L = 0.5
H, R = 10 , 3 pulses positive and 3 pulses negative.
THERMAL RESISTANCE
QUALITY SPECIFICATION
In accordance with SNW-FQ-0611.
CHARACTERISTICS
VDD =5V; Tamb =25 °C; measured in Fig.1; unless otherwise specied.
SYMBOL
PARAMETER
CONDITIONS
MIN.
MAX.
UNIT
VDD
supply voltage
6.0
V
Tstg
storage temperature
55
+150
°C
TXTAL
maximum crystal temperature
+150
°C
Tamb
operating ambient temperature
40
+85
°C
Ves
electrostatic handling
note 1
2000
+2000
V
note 2
200
+200
V
SYMBOL
PARAMETER
VALUE
UNIT
Rth j-a
thermal resistance from junction to ambient in free air
DIL8
100
K/W
SO8
210
K/W
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
Supply
VDD
supply voltage
4.0
5.0
5.5
V
IDD
supply current
at code 0000H
3.4
6.0
mA
Digital inputs; pins WS, BCK and DATA
|I
IL|
input leakage current LOW
VI = 0.8 V
10
A
|IIH|
input leakage current HIGH
VI = 2.4 V
10
A
fBCK
clock frequency
18.4
MHz
BR
bit rate data input
18.4
Mbits/s
fWS
word select input frequency
384
kHz
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