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参数资料
| 型号： | TDA1387T-T |
| 厂商： | NXP SEMICONDUCTORS |
| 元件分类： | DAC |
| 英文描述： | SERIAL INPUT LOADING, 0.2 us SETTLING TIME, 16-BIT DAC, PDSO8 |
| 文件页数： | 15/16页 |
| 文件大小： | 110K |
| 代理商： | TDA1387T-T |
1995 Dec 11
8
Philips Semiconductors
Preliminary specication
Stereo Continuous Calibration DAC (CC-DAC)
TDA1387T
Notes
1. Vripple = 1% of the supply voltage; fripple = 100 Hz.
2. Values are proportional to VDD.
3. Measured with 1 kHz sine wave generated at a sampling rate of 192 kHz.
QUALITY SPECIFICATION
In accordance with
“SNW-FQ-611E”. The numbers of the quality specification can be found in the “Quality Reference
Handbook”. The handbook can be ordered using the code 9397 750 00192.
Analog outputs; IOL and IOR
RES
output resolution
16
bits
VDCC
DC output voltage
compliance
0
3.5
V
Io(p-p)
AC output signal current
(peak-to-peak value)
note 2
0.86
1.0
1.14
mA
TCFS
full-scale temperature
coefcient
±400 × 106
Ibias
output bias current
note 2
0.93
1.08
1.23
mA
Vref
output reference voltage
note 2
1
6VDD
V
Rref
output resistance at pin 7
7.6
11.4
14.8
k
(TDH + N)/S
total harmonic distortion
plus noise-to-signal ratio
at 0 dB signal level; note 3
88
78
dB
at 0 dB signal level; note 3
0.004
0.01
%
at
60 dB signal level; note 3 33
24
dB
at
60 dB signal level; note 3
2.2
6
%
at
60 dB; A-weighted; note 3 35
dB
at
60 dB; A-weighted; note 3
1.8
%
fi = 20 Hz to 20 kHz;
at 0 dB signal level; note 3
84
70
dB
fi = 20 Hz to 20 kHz;
at 0 dB signal level; note 3
0.006
0.03
%
tcs
current settling time to
±1 LSB
0.2
s
α
cs
channel separation
86
95
dB
I
O
unbalance between
outputs
note 3
0.2
0.3
dB
t
d
delay time between outputs
±0.2
s
S/N
signal-to-noise ratio at
bipolar zero
A-weighted at code 0000H
86
98
dB
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
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