参数资料
型号: TLC339QJ
厂商: Texas Instruments, Inc.
英文描述: DIODE ZENER TRIPLE ISOLATED 200mW 24Vz 5.2mA-Izt 0.05 0.1uA-Ir 18 SOT-363 3K/REEL
中文描述: LinCMOSE微功耗四比较器
文件页数: 9/17页
文件大小: 258K
代理商: TLC339QJ
TLC139, TLC339, TLC339Q
LinCMOS
MICROPOWER QUAD COMPARATORS
SLCS119 – DECEMBER 1986 – REVISED JANUARY 1991
9
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
Propagation delay time is defined as the interval between the application of an input step function and the instant when
the output reaches 50% of its maximum value. Propagation delay time, low-to-high-level output, is measured from
the leading edge of the input pulse, while propagation delay time, high-to-low-level output, is measured from the
trailing edge of the input pulse. Propagation delay time measurement at low input signal levels can be greatly affected
by the input offset voltage. The offset voltage should be balanced by the adjustment at the inverting input as shown
in Figure 3, so that the circuit is just at the transition point. Then a low signal, for example 105-mV or 5-mV overdrive,
causes the output to change state.
90%
50%
Pulse
Generator
VDD
DUT
TEST CIRCUIT
Input Offset Voltage
Compensation Adjustment
Low-to-High-Level
Output
VOLTAGE WAVEFORMS
High-to-Low-Level
Output
1
μ
F
5.1 k
50
1 k
1 V
–1 V
10
10 Turn
0.1
μ
F
CL
(see Note A)
Overdrive
Input
Overdrive
Input
100 mV
100 mV
50%
10%
tPLH
tPHL
tTHL
NOTE A: CL includes probe and jig capacitance.
Figure 3. Propagation Delay, Rise, and Fall Times Test Circuit and Voltage Waveforms
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