参数资料
型号: TLC372QP
厂商: Texas Instruments, Inc.
元件分类: 比较器
英文描述: LinCMOSE DUAL DIFFERENTIAL COMPARATORS
中文描述: LinCMOSE双差分比较器
文件页数: 8/12页
文件大小: 183K
代理商: TLC372QP
TLC372, TLC372Q, TLC372Y
LinCMOS
DUAL DIFFERENTIAL COMPARATORS
SLCS114B – NOVEMBER 1983 – REVISED MARCH 1999
8
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
Response time is defined as the interval between the application of an input step function and the instant when the
output reaches 50% of its maximum value. Response time, low-to-high-level output, is measured from the leading
edge of the input pulse, while response time, high-to-low-level output, is measured from the trailing edge of the input
pulse. Response-time measurement at low input signal levels can be greatly affected by the input offset voltage. The
offset voltage should be balanced by the adjustment at the inverting input as shown in Figure 3, so that the circuit
is just at the transition point. Then a low signal, for example 105-mV or 5-mV overdrive, causes the output to change
state.
ááá
Low-to-High-
Level Output
DUT
5.1 k
1
μ
F
0.1
μ
F
1 k
50
CL
(see Note A)
VDD
Pulse
Generator
Input Offset Voltage
Compensation Adjustment
10
10 Turn
1 V
–1 V
Overdrive
Input
100 mV
Overdrive
Input
tf
tPHL
10%
50%
90%
90%
50%
tr
tPLH
High-to-Low-
Level Output
TEST CIRCUIT
VOLTAGE WAVEFORMS
10%
100 mV
NOTE A: CL includes probe and jig capacitance.
Figure 3. Response, Rise, and Fall Times Circuit and Voltage Waveforms
相关PDF资料
PDF描述
TLC372MFK LinCMOSE DUAL DIFFERENTIAL COMPARATORS
TLC372Q LinCMOSE DUAL DIFFERENTIAL COMPARATORS
TLC372Y LinCMOSE DUAL DIFFERENTIAL COMPARATORS
TLC374QD LinCMOSE QUADRUPLE DIFFERENTIAL COMPARATORS
TLC374MFK LinCMOSE QUADRUPLE DIFFERENTIAL COMPARATORS
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