参数资料
型号: TLE208xY
厂商: Texas Instruments, Inc.
英文描述: EXCALIBUR HIGH-SPEED JFET-INPUT OPERATIONAL AMPLIFIERS
中文描述: 神剑高速JFET输入运算放大器
文件页数: 40/69页
文件大小: 1131K
代理商: TLE208XY
TLE208x, TLE208xA, TLE208xY
EXCALIBUR HIGH-SPEED JFET-INPUT
OPERATIONAL AMPLIFIERS
SLOS182A – FEBRUARY 1997 – REVISED MARCH 2000
40
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
+
2 k
2 k
RL
CL
VO
VCC+
VCC+
VI
+
10 k
VO
CL
100
RL
VCC+
VCC+
VI
Includes fixture capacitance
Includes fixture capacitance
Figure 1. Slew-Rate Test Circuit
Figure 2. Unity-Gain Bandwidth
and Phase-Margin Test Circuit
Includes fixture capacitance
+
+
2 k
VCC+
VCC+
VO
VO
VCC–
VCC–
RS
RS
Ground Shield
Picoammeters
Figure 3. Noise-Voltage Test Circuit
Figure 4. Input-Bias and Offset-
Current Test Circuit
+
VCC+
VO
VCC–
IN–
IN+
Cic
Cic
Cid
Figure 5. Internal Input Capacitance
typical values
Typical values presented in this data sheet represent the median (50% point) of device parametric performance.
input bias and offset current
At the picoampere bias-current level typical of the TLE208x and TLE208xA, accurate measurement of the bias
becomes difficult. Not only does this measurement require a picoammeter, but test socket leakages can easily
exceed the actual device bias currents. To accurately measure these small currents, Texas Instruments uses
a two-step process. The socket leakage is measured using picoammeters with bias voltages applied but with
no device in the socket. The device is then inserted in the socket and a second test is performed that measures
both the socket leakage and the device input bias current. The two measurements are then subtracted
algebraically to determine the bias current of the device.
相关PDF资料
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