- 您现在的位置：买卖IC网 > PDF目录69494 > TLE4925 (INFINEON TECHNOLOGIES AG) SPECIALTY ANALOG CIRCUIT, PSSS3 PDF资料下载
参数资料
| 型号： | TLE4925 |
| 厂商： | INFINEON TECHNOLOGIES AG |
| 元件分类： | 模拟信号调理 |
| 英文描述： | SPECIALTY ANALOG CIRCUIT, PSSS3 |
| 封装： | PLASTIC, SSO-3 |
| 文件页数： | 13/28页 |
| 文件大小： | 1066K |
| 代理商： | TLE4925 |
第1页第2页第3页第4页第5页第6页第7页第8页第9页第10页第11页第12页当前第13页第14页第15页第16页第17页第18页第19页第20页第21页第22页第23页第24页第25页第26页第27页第28页
Data Sheet
Page 20 of 28
10/02/2005
4.1 Electro Magnetic Compatibility - (values depend on RSeries!)
Ref. ISO 7637-1; see test circuit of figure 4 and 5;
BPP = 10mT (ideal sinusoidal signal); VS=13.5V ± 0.5V, fB= 1000Hz; T= 25°C; RSeries ≥ 200;
No.
Parameter
Symbol
Level/typ
Status
4.1.1
Testpulse 1
Testpulse 2
Testpulse 3a
Testpulse 3b
Testpulse 4
Testpulse 5
VEMC
IV / -100V
IV / 100V
IV / -150V
IV / 100V
IV / -7V
IV / 86.5V
C
A
C
Note: Test criteria for status A: No missing pulse no additional pulse on the IC output signal plus
duty cycle and jitter are in the specification limits.
Test criteria for status B: No missing pulse no additional pulse on the IC output signal.
(Output signal “OFF” means switching to the voltage of the pull-up resistor).
Test criteria for status C: One or more parameter can be out of specification during the
exposure but returns automatically to normal operation after exposure is removed.
Test criteria for status E: IC destroyed.
Ref. ISO 7637-3; TP 1 and TP 2 ref. DIN 40839-3; see test circuit of figure 4 and 5;
BPP = 10mT (ideal sinusoidal signal); VS=13.5V ± 0.5V, fB= 1000Hz; T= 25°C; RSeries ≥ 200;
No.
Parameter
Symbol
Level/typ
Status
4.1.2
Testpulse 1
Testpulse 2
Testpulse 3a
Testpulse 3b
VEMC
IV / -30V
IV / 30V
IV / -60V
IV / 40V
A
Ref. ISO 11452-3; see test circuit of figure 4 and 5; measured in TEM-cell;
BPP = 4mT (ideal sinusoidal signal); VS=13.5V ± 0,5V, fB= 200Hz; T= 25°C; RSeries ≥ 200;
No.
Parameter
Symbol
Level/max
Remarks
4.1.3
EMC field strength
ETEM-Cell
IV / 200V/m
AM=80%, f=1kHz;
Note: Stresses above those listed here may cause permanent damage to the device. Exposure to
absolute maximum rating conditions for extended periods may affect device reliability.
Test condition for the trigger window: fB-field=200Hz, Bpp=4mT, vertical limits are ±200mV
and horizontal limits are
±200s.
相关PDF资料 |
PDF描述 |
|---|---|
| TLE4966H | SPECIALTY ANALOG CIRCUIT, PDSO6 |
| TLE5012-E0742 | POSITION SENSOR, PDSO8 |
| TLE5012-E0318 | POSITION SENSOR, PDSO8 |
| TLE5203 | BRUSH DC MOTOR CONTROLLER, 4 A, PZFM7 |
| TLE5203G | BRUSH DC MOTOR CONTROLLER, 4 A, PSSO7 |
相关代理商/技术参数 |
参数描述 |
|---|---|
| TLE4925 CHIP | 功能描述:板机接口霍耳效应/磁性传感器 MAGNETIC SENSOR IC’S RoHS:否 制造商:Honeywell 类型:Bipolar Hall-Effect Digital Position Sensor 工作电源电压:3 V to 24 V 电源电流:3.5 mA 最大输出电流:20 mA 工作点最小值/最大值:5 G, 55 G 最小/最大释放点（Brp）:- 55 G, - 5 G 最大工作温度:+ 150 C 安装风格:SMD/SMT 封装 / 箱体:SOT-23 |
| TLE4925C | 功能描述:板机接口霍耳效应/磁性传感器 Dynamic Differential Hall Effect Sensor RoHS:否 制造商:Honeywell 类型:Bipolar Hall-Effect Digital Position Sensor 工作电源电压:3 V to 24 V 电源电流:3.5 mA 最大输出电流:20 mA 工作点最小值/最大值:5 G, 55 G 最小/最大释放点（Brp）:- 55 G, - 5 G 最大工作温度:+ 150 C 安装风格:SMD/SMT 封装 / 箱体:SOT-23 |
| TLE4925CHIPX6SA1 | 制造商:Infineon Technologies AG 功能描述:MAGNE 制造商:Infineon Technologies AG 功能描述:MAGNETIC SENSOR IC'S - Gel-pak, waffle pack, wafer, diced wafer on film |
| TLE4925CHIPZV | 制造商:Infineon Technologies AG 功能描述:HALLEFFECT IC'S - Gel-pak, waffle pack, wafer, diced wafer on film |
| TLE4925CHTE6747XA | 制造商:Infineon Technologies AG 功能描述:Hall Effect Sensor 50mA 5V/9V/12V/15V/18V/24V 3-Pin SSO T/R |
发布紧急采购，3分钟左右您将得到回复。