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参数资料
| 型号： | TP30-100 |
| 厂商： | STMICROELECTRONICS |
| 元件分类： | TVS二极管 - 瞬态电压抑制 |
| 英文描述： | BIDIRECTIONAL, SILICON, TVS DIODE, DO-15 |
| 封装： | PLASTIC PACKAGE-2 |
| 文件页数： | 4/6页 |
| 文件大小： | 152K |
| 代理商： | TP30-100 |
TP30-xxx Series
4/6
TEST CIRCUIT 2 for IH parameter.
R
-VP
VBAT = - 48 V
Surge generator
D.U.T.
This is a GO-NOGO Test which allows to confirm the holding current (IH) level in a functional
test circuit.
TEST PROCEDURE :
n 1) Adjust the current level at the IH value by short circuiting the AK of the D.U.T.
2) Fire the D.U.T with a surge Current : Ipp = 10A , 10/1000
s.
3) The D.U.T will come back off-state within 50 ms max.
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