参数资料
型号: TRS202CDWG4
厂商: Texas Instruments
文件页数: 12/17页
文件大小: 0K
描述: IC DRVR/RCVR RS232 ESD DL 16SOIC
标准包装: 760
类型: 线路收发器
驱动器/接收器数: 2/2
规程: RS232
电源电压: 4.5 V ~ 5.5 V
安装类型: 表面贴装
封装/外壳: 16-SOIC(0.295",7.50mm 宽)
供应商设备封装: 16-SOIC
包装: 管件
www.ti.com
DRIVER SECTION
Electrical Characteristics
(1)
Switching Characteristics
(1)
ESD Protection
5-V DUAL RS-232 LINE DRIVER/RECEIVER
WITH
±15-kV ESD PROTECTION
SLLS808 – JULY 2007
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Figure 4)
PARAMETER
TEST CONDITIONS
MIN
TYP(2)
MAX
UNIT
DOUT at RL = 3 k to
VOH
High-level output voltage
DIN = GND
5
9
V
GND,
DOUT at RL = 3 k to
VOL
Low-level output voltage
DIN = VCC
–5
–9
V
GND,
IIH
High-level input current
VI = VCC
15
200
μA
IIL
Low-level input current
VI at 0 V
–15
–200
μA
IOS
(3)
Short-circuit output current
VCC = 5.5 V,
VO = 0 V
±10
±60
mA
ro
Output resistance
VCC, V+, and V– = 0 V,
VO = ±2 V
300
(1)
Test conditions are C1–C4 = 0.1
μF at VCC = 5 V ± 0.5 V.
(2)
All typical values are at VCC = 5 V, and TA = 25°C.
(3)
Short-circuit durations should be controlled to prevent exceeding the device absolute power dissipation ratings, and not more than one
output should be shorted at a time.
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Figure 4)
PARAMETER
TEST CONDITIONS
MIN
TYP(2)
MAX
UNIT
CL = 50 to 1000 pF,
RL = 3 k to 7 k,
Maximum data rate
120
kbit/s
One DOUT switching,
Propagation delay time,
CL = 2500 pF,
RL = 3 k,
tPLH(D)
2
μs
low- to high-level output
All drivers loaded,
Propagation delay time,
CL = 2500 pF,
RL = 3 k,
tPHL(D)
2
μs
high- to low-level output
All drivers loaded,
CL = 150 pF to 2500 pF,
RL = 3 k to 7 k,
tsk(p)
Pulse skew(3)
300
ns
Slew rate, transition region
CL = 50 pF to 1000 pF,
RL = 3 k to 7 k,
SR(tr)
3
6
30
V/
μs
(see Figure 1)
VCC = 5 V
(1)
Test conditions are C1–C4 = 0.1
μF at VCC = 5 V ± 0.5 V.
(2)
All typical values are at VCC = 5 V, and TA = 25°C.
(3)
Pulse skew is defined as |tPLH – tPHL| of each channel of the same device.
PIN
TEST CONDITIONS
TYP
UNIT
DOUT, RIN
Human-Body Model (HBM)
±15
kV
4
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