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参数资料
| 型号： | VCC6-QCF-26M5625 |
| 厂商： | VECTRON INTERNATIONAL |
| 元件分类： | XO, clock |
| 英文描述： | CRYSTAL OSCILLATOR, CLOCK, 26.5625 MHz, LVPECL OUTPUT |
| 封装： | ROHS COMPLIANT, HERMETIC SEALED, CERAMIC, SMD, 6 PIN |
| 文件页数： | 5/8页 |
| 文件大小： | 232K |
| 代理商： | VCC6-QCF-26M5625 |
VCC6-Q/R Series, 2.5 and 3.3v PECL Crystal Oscillator
Vectron International 267 Lowell Rd, Hudson NH 03051
Tel: 1-88-VECTRON-1
e-mail: vectron@vectron.com
Enable/Disable Functional Description
Under normal operation the Enable/Disable is left open, or set to a logic high state, and the VCC6 is in
oscillation mode and outputs are enabled (active). When the E/D is set to a logic low, the oscillator stops
and the both the output and complementary outputs are in a high impedance state. This helps facilitate
board testing and troubleshooting.
Power Saving Pull-Up Resistor
The E/D pull-up resistor changes in response to the input logic level; the pull-up resistor is a large value
when E/D is set to a logic low, which reduces the current consumed. When E/D is open, or set to a logic
high, the pull-up resistance becomes a smaller value which helps decrease the effects of external noise.
Absolute Maximum Ratings
Stresses in excess of the absolute maximum ratings can permanently damage the device. Functional
operation is not implied at these or any other conditions in excess of conditions represented in the
operational sections of this data sheet. Exposure to absolute maximum ratings for extended periods may
adversely affect device reliability.
Table 4. Absolute Maximum Ratings
Parameter
Symbol
Ratings
Unit
Power Supply
VDD
-0.5 to +7.0
Vdc
Enable/Disable
VIN
-0.5 to VDD+0.5
Vdc
Storage Temperature
Tstorage
-55/125
°C
Reliability
The VCC6 qualification tests included:
Table 5. Environnemental Compliance
Parameter
Conditions
Mechanical Shock
MIL-STD-883 Method 2002
Mechanical Vibration
MIL-STD-883 Method 2007
Solderability
MIL-STD-883 Method 2003
Gross and Fine Leak
MIL-STD-883 Method 1014
Resistance to Solvents
MIL-STD-883 Method 2016
Handling Precautions
Although ESD protection circuitry has been designed into the the VCC6, proper precautions should be
taken when handling and mounting. VI employs a Human Body Model and a Charged-Device Model
(CDM) for ESD susceptibility testing and design protection evaluation. ESD thresholds are dependent on
the circuit parameters used to define the model. Although no industry wide standard has been adopted
for the CDM, a standard HBM of resistance = 1.5kohms and capacitance = 100pF is widely used and
therefore can be used for comparison purposes.
Table 6. ESD Ratings
Model
Minimum
Conditions
Human Body Model
1500
MIL-STD-883 Method 3015
Charged Device Model
1000
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