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参数资料
| 型号： | WED7F416IDE33ADC25 |
| 厂商： | MICROSEMI CORP-PMG MICROELECTRONICS |
| 元件分类： | PROM |
| 英文描述： | 26M X 16 FLASH 3.3V PROM, DMA144 |
| 封装： | SO-DIMM-144 |
| 文件页数： | 4/8页 |
| 文件大小： | 167K |
| 代理商： | WED7F416IDE33ADC25 |
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Summer
2004 Fairchild Semiconductor Corporation
www.fairchildsemi.com
FMS6400-1 Rev. 1.0.1
4
Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device
reliability. The absolute maximum ratings are stress ratings only.
Symbol
Parameter
Min.
Max.
Unit
VCC
DC Supply Voltage
-0.3
6.0
V
VIO
Analog and Digital I/O
-0.3
VCC +0.3
V
IOUT
Output Current Any One Channel, Do Not Exceed
40
mA
Recommended Operating Conditions
Symbol
Parameter
Min.
Typ.
Max.
Unit
TA
Operating Temperature Range
0
+70
°C
VCC
Supply Voltage Range
4.75
5.00
5.25
V
ESD Information
Symbol
Parameter
Value
Unit
ESD
Human Body Model, JESD22-A114
8
kV
Charged Device Model, JESD22-C101
2
Reliability Information
Symbol
Parameter
Min.
Typ.
Max.
Unit
TJ
Junction Temperature
+150
°C
TSTG
Storage Temperature Range
-65
+150
°C
TL
Lead Temperature (Soldering, 10 seconds)
300
°C
ΘJA
Thermal Resistance
(JEDEC Standard Multi-Layer Test Boards, Still Air)
115
°C/W
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