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参数资料
| 型号： | WF128K32-120G1UM5A |
| 厂商： | WHITE ELECTRONIC DESIGNS CORP |
| 元件分类： | PROM |
| 英文描述： | 128K X 32 FLASH 5V PROM MODULE, 120 ns, CQFP68 |
| 封装： | 23.90 X 23.90 MM, 3.56 MM HEIGHT, CERAMIC, QFP-68 |
| 文件页数： | 11/16页 |
| 文件大小： | 388K |
| 代理商： | WF128K32-120G1UM5A |
4
White Electronic Designs Corporation Phoenix AZ (602) 437-1520
WF128K32-XXX5
White Electronic Designs
AC CHARACTERISTICS WRITE/ERASE/PROGRAM OPERATIONS, CS CONTROLLED
(VCC = 5.0V, VSS = 0V, TA= -55°C TO+125°C)
FIG. 4
Notes:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75 W.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
AC TEST CONDITIONS
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0
V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
Parameter
Symbol
-50
-60
-70
-90
-120
-150
Unit
Min
Max
Min
Max
Min Max
Min
Max
Min
Max
Min
Max
Write Cycle Time
tAVAV
tWC
50
60
70
90
120
150
ns
WE Setup Time
t WLEL
tWS
0
00
ns
CS Pulse Width
tELEH
tCP
25
30
35
45
50
ns
Address Setup Time
tAVEL
tAS
0
00
ns
Data Setup Time
tDVEH
tDS
25
30
45
50
ns
Data Hold Time
tEHDX
tDH
0
00
ns
Address Hold Time
t ELAX
tAH
40
45
50
ns
WE Hold from WE High
tEHWH
tWH
0
00
ns
CS Pulse Width High
tEHEL
tCPH
20
ns
Duration of Programming Operation
tWHWH1
14
s
Duration of Erase Operation
tWHWH2
2.2
60
2.2
60
2.2
60
2.2
60
2.2
60
2.2
60
sec
Read Recovery before Write
tGHEL
0
00
ns
Chip Programming Time
12.5
sec
AC TEST CIRCUIT
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