参数资料
型号: WS128K32-120H1IA
厂商: WHITE ELECTRONIC DESIGNS CORP
元件分类: SRAM
英文描述: 128K X 32 MULTI DEVICE SRAM MODULE, 120 ns, CPGA66
封装: 1.075 X 1.075 MM, CERAMIC, PGA-66
文件页数: 4/9页
文件大小: 379K
代理商: WS128K32-120H1IA
4
White Electronic Designs Corporation (602) 437-1520 www.wedc.com
White Electronic Designs
WS128K32-XXX
June 2004
Rev. 4
I
Current Source
D.U.T.
C
= 50 pf
eff
I
OL
V
1.5V
(Bipolar Supply)
Z
Current Source
OH
AC CHARACTERISTICS
VCC = 5.0V, GND = 0V, -55°C ≤ TA ≤ +125°C
Parameter
Write Cycle
Symbol
-70
-85
-100
-120
Units
Min
Max
Min
Max
Min
Max
Min
Max
Write Cycle Time
tWC
70
85
100
120
ns
Chip Select to End of Write
tCW
60
75
80
100
ns
Address Valid to End of Write
tAW
60
75
80
100
ns
Data Valid to End of Write
tDW
30
35
40
50
ns
Write Pulse Width
tWP
50
55
70
80
ns
Address Setup Time
tAS
5555
ns
Address Hold Time
tAH
5555
ns
Output Active from End of Write
tOW1
5555
ns
Write Enable to Output in High Z
tWHZ1
25
35
ns
Data Hold Time
tDH
0000
ns
Parameter
Read Cycle
Symbol
-70
-85
-100
-120
Units
Min
Max
Min
Max
Min
Max
Min
Max
Read Cycle Time
tRC
70
85
100
120
ns
Address Access Time
tAA
70
85
100
120
ns
Output Hold from Address Change
tOH
3333
ns
Chip Select Access Time
tACS
70
85
100
120
ns
Output Enable to Output Valid
tOE
35
45
50
60
ns
Chip Select to Output in Low Z
tCLZ1
3333
ns
Output Enable to Output in Low Z
tOLZ1
0000
ns
Chip Disable to Output in High Z
tCHZ1
25
35
ns
Output Disable to Output in High Z
tOHZ1
25
35
ns
1. This parameter is guaranteed by design but not tested.
AC CHARACTERISTICS
VCC = 5.0V, GND = 0V, -55°C ≤ TA ≤ +125°C
FIGURE. 4 – AC TEST CIRCUIT
Notes:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75 .
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
AC Test Conditions
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0
V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
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