- 您现在的位置：买卖IC网 > PDF目录202125 > WS128K32-35G1TCA (WHITE ELECTRONIC DESIGNS CORP) 128K X 32 MULTI DEVICE SRAM MODULE, 35 ns, CQFP68 PDF资料下载
参数资料
| 型号： | WS128K32-35G1TCA |
| 厂商： | WHITE ELECTRONIC DESIGNS CORP |
| 元件分类： | SRAM |
| 英文描述： | 128K X 32 MULTI DEVICE SRAM MODULE, 35 ns, CQFP68 |
| 封装： | 23.90 MM, 4.06 MM HEIGHT, CERAMIC, QFP-68 |
| 文件页数： | 5/10页 |
| 文件大小： | 437K |
| 代理商： | WS128K32-35G1TCA |
4
White Electronic Designs Corporation (602) 437-1520 www.whiteedc.com
White Electronic Designs
WS128K32-XXX
FIG. 4
Notes:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75 W.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
AC TEST CONDITIONS
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0
V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
AC CHARACTERISTICS
(VCC = 5.0V, GND = 0V, TA = -55°C TO +125°C)
Parameter
Symbol
-15
-17
-20
-25
-35
-45
-55
Units
Read Cycle
Min Max Min Max Min
Max Min
Max
Min
Max Min Max
Read Cycle Time
tRC
15
17
20
25
35
45
55
ns
Address Access Time
tAA
15
17
20
25
35
45
55
ns
Output Hold from Address Change
tOH
0
000
00
ns
Chip Select Access Time
tACS
15
17
20
25
35
45
55
ns
Output Enable to Output Valid
tOE
10
12
15
20
25
30
ns
Chip Select to Output in Low Z
tCLZ1
3
333
33
ns
Output Enable to Output in Low Z
tOLZ1
0
000
00
ns
Chip Disable to Output in High Z
tCHZ1
12
20
ns
Output Disable to Output in High Z
tOHZ1
12
20
ns
1. This parameter is guaranteed by design but not tested.
AC CHARACTERISTICS
(VCC = 5.0V, GND = 0V, TA = -55°C TO +125°C)
Parameter
Symbol
-15
-17
-20
-25
-35
-45
-55
Units
Write Cycle
Min Max Min Max Min Max Min
Max
Min
Max Min
Max Min Max
Write Cycle Time
tWC
15
17
20
25
35
45
55
ns
Chip Select to End of Write
tCW
14
15
20
25
30
45
ns
Address Valid to End of Write
tAW
14
15
20
25
30
45
ns
Data Valid to End of Write
tDW
10
12
15
20
25
ns
Write Pulse Width
tWP
14
15
20
25
30
45
ns
Address Setup Time
tAS
00
0
ns
Address Hold Time
tAH
00
0
ns
Output Active from End of Write
tOW1
33
4
ns
Write Enable to Output in High Z
tWHZ1
10
12
15
20
25
ns
Data Hold Time
tDH
00
0
ns
1. This parameter is guaranteed by design but not tested.
WS128K32-XXX /
EDI8C32128C
AC TEST CIRCUIT
相关PDF资料 |
PDF描述 |
|---|---|
| WS128K32-45G1TQ | 128K X 32 MULTI DEVICE SRAM MODULE, 45 ns, CQFP68 |
| WED2ZL362MSJ38BC | 2M X 36 MULTI DEVICE SRAM MODULE, 3.8 ns, PBGA119 |
| WMS256K16L-20DLCA | 256K X 16 STANDARD SRAM, 20 ns, CDSO44 |
| WS128K32-55G2LQ | 128K X 32 MULTI DEVICE SRAM MODULE, 55 ns, CQFP68 |
| W3EG7266S202D3 | 64M X 72 DDR DRAM MODULE, 0.75 ns, DMA184 |
相关代理商/技术参数 |
参数描述 |
|---|---|
| WS128K32-35G2I | 制造商:未知厂家 制造商全称:未知厂家 功能描述:x32 SRAM Module |
| WS128K32-35G2LIA | 制造商:White Electronic Designs 功能描述:Res Thin Film 2010 374K Ohm 0.1% 1/4W ±10ppm/°C Molded SMD Plastic T/R 制造商:Microsemi Corporation 功能描述:MICROCIRCUIT, SRAM, 128K X 32 - Bulk |
| WS128K32-35G2M | 制造商:未知厂家 制造商全称:未知厂家 功能描述:x32 SRAM Module |
| WS128K32-35G2Q | 制造商:未知厂家 制造商全称:未知厂家 功能描述:x32 SRAM Module |
| WS128K32-35G2TC | 制造商:未知厂家 制造商全称:未知厂家 功能描述:x32 SRAM Module |
发布紧急采购，3分钟左右您将得到回复。