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参数资料
| 型号： | WS27C256L-15DMB |
| 元件分类： | PROM |
| 英文描述： | 32K X 8 UVPROM, 150 ns, CDIP28 |
| 封装： | 0.600 INCH, CERDIP-28 |
| 文件页数： | 3/5页 |
| 文件大小： | 50K |
| 代理商： | WS27C256L-15DMB |
SYMBOL
PARAMETER
CONDITIONS
TYP(6)
MAX
UNITS
CIN
Input Capacitance
VIN = 0V
4
6
pF
COUT
Output Capacitance
VOUT = 0V
8
12
pF
CVPP
VPP Capacitance
VPP = 0 V
18
25
pF
4-21
WS27C256L
AC READ TIMING DIAGRAM
tACC
tOH
ADDRESS VALID
VALID OUTPUT
ADDRESSES
VIH
VIL
tOE
tDF
tCE
CE
OE
VIH
VIL
VIH
VIL
HIGH Z
(5)
(4)
OUTPUT
CAPACITANCE(5) T
A = 25 °C, f = 1 MHz
100 pF
(INCLUDING SCOPE
AND JIG
CAPACITANCE)
820
2.01 V
D.U.T.
A.C. TESTING INPUT/OUTPUT WAVEFORM
TEST LOAD (High Impedance Test Systems)
2.4
0.4
2.0
0.8
2.0
0.8
TEST
POINTS
NOTES: 5. This parameter is only sampled and is not 100% tested.
6. Typical values are for TA = 25°C and nominal supply voltages.
A.C. testing inputs are driven at 2.4 V for a logic "1" and 0.4 V
for a logic "0." Timing measurements are made at 2.0 V for a
logic "1" and 0.8 V for a logic "0".
NOTE:
4. OE may be delayed up to tCE – tOE after the falling edge of CE without impact on tCE.
NOTE: 7. Provide adequate decoupling capacitance as close as possible to this device to achieve the published A.C. and D.C. parameters.
A 0.1 microfarad capacitor in parallel with a 0.01 microfarad capacitor connected between VCC and ground is recommended.
Inadequate decoupling may result in access time degradation or other transient performance failures.
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相关代理商/技术参数 |
参数描述 |
|---|---|
| WS27C256L-15TMB | 制造商:STMICROELECTRONICS 制造商全称:STMicroelectronics 功能描述:Military 32K x 8 CMOS EPROM |
| WS27C256L-20 | 制造商:STMICROELECTRONICS 制造商全称:STMicroelectronics 功能描述:Military 32K x 8 CMOS EPROM |
| WS27C256L-20DMB | 制造商:STMICROELECTRONICS 制造商全称:STMicroelectronics 功能描述:Military 32K x 8 CMOS EPROM |
| WS28 | 制造商:Datak Corporation 功能描述: 制造商:Datak Corporation 功能描述:Ratchet Crimp Tool For Tool Kits And Service Aids |
| WS-2801 | 制造商:未知厂家 制造商全称:未知厂家 功能描述:13723479007裕明小李 |
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