X24C44
7
ABSOLUTE MAXIMUM RATINGS*
Temperature under Bias .................. –65
°
C to +135
°
C
Storage Temperature ....................... –65
°
C to +150
°
C
Voltage on any Pin with
Respect to V
SS............................................
–1V to +7V
D.C. Output Current .............................................5mA
Lead Temperature
(Soldering, 10 seconds).............................. 300
°
C
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
This is a stress rating only and the functional operation of
the device at these or any other conditions above those
indicated in the operational sections of this specification is
not implied. Exposure to absolute maximum rating condi-
tions for extended periods may affect device reliability.
CAPACITANCE
T
A
= +25
°
C, f = 1MHz, V
CC
= 5V
Symbol
Parameter
Max.
Units
Test Conditions
C
OUT(2)
C
IN(2)
Output Capacitance
Input Capacitance
8
6
pF
pF
V
OUT
= 0V
V
IN
= 0V
3832 PGM T06.1
RECOMMENDED OPERATING CONDITIONS
Temperature
Min.
0
°
C
–40
°
C
–55
°
C
Max.
+70
°
C
+85
°
C
+125
°
C
3832 PGM T02.1
Commercial
Industrial
Military
Supply Voltage
Limits
5V
±
10%
X24C44
3832 PGM T03.1
D.C. OPERATING CHARACTERISTICS
(Over recommended operating conditions unless otherwise specified.)
Limits
Symbol
Parameter
Min.
Max.
Units
Test Conditions
l
CC
V
CC
Supply Current
(TTL Inputs)
V
CC
Standby Current
(TTL Inputs)
V
CC
Standby Current
(CMOS Inputs)
Input Load Current
Output Leakage Current
Input LOW Voltage
Input HIGH Voltage
Output LOW Voltage
Output HIGH Voltage
10
mA
SK = 0.4V/2.4V Levels @ 1MHz,
DO = Open, All Other Inputs = V
IH
DO = Open, CE = V
IL
,
All Other Inputs = V
IH
DO = Open, CE = V
SS
All Other Inputs = V
CC
– 0.3V
V
IN
= V
SS
to V
CC
V
OUT
= V
SS
to V
CC
I
SB1
1
mA
I
SB2
50
μ
A
I
LI
I
LO
V
lL(1)
V
IH(1)
V
OL
V
OH
10
10
0.8
μ
A
μ
A
V
V
V
V
–1
2
V
CC
+ 1
0.4
I
OL
= 4.2mA
I
OH
= –2mA
2.4
3832 PGM T04.3
ENDURANCE AND DATA RETENTION
Parameter
Min.
Units
Endurance
Store Cycles
Data Retention
100,000
1,000,000
100
Data Changes Per Bit
Store Cycles
Years
3832 PGM T05
Notes:
(1) V
IL
min. and V
IH
max. are for reference only and are not tested.
(2) This parameter is periodically sampled and not 100% tested.