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参数资料
| 型号： | ZLDO1117K33TC |
| 厂商： | Diodes Inc |
| 文件页数： | 2/14页 |
| 文件大小： | 0K |
| 描述： | IC REG LDO 3.3V 1A TO252-3 |
| 产品变化通告： | Bond Wire Change 14/Sept/2011 |
| 标准包装： | 1 |
| 稳压器拓扑结构： | 正，固定式 |
| 输出电压： | 3.3V |
| 输入电压： | 最高 18V |
| 电压 - 压降（标准）： | 1.11V @ 1A |
| 稳压器数量： | 1 |
| 电流 - 输出： | 1A（最小值） |
| 电流 - 限制（最小）： | 1.1A |
| 工作温度： | -40°C ~ 125°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | TO-252-3，DPak（2 引线+接片），SC-63 |
| 供应商设备封装： | TO-252-3 |
| 包装： | 标准包装 |
| 产品目录页面： | 1476 (CN2011-ZH PDF) |
| 其它名称： | ZLDO1117K33DIDKR |
A Product Line of
Diodes Incorporated
ZLDO1117
Pin Descriptions
Pin
Name
Adj (GND)
I/O
I
Pin
Number
1
Function
A resistor divider from this pin to the V OUT pin and ground sets the output voltage (Ground only for
Fixed-Mode).
The output of the regulator. A minimum of 4.7μF capacitor (0.05 ? ≤ ESR ≤ 0.5 ? ) must be connected
V OUT
O
2
from this pin to ground to insure stability. For improved ac load response a larger output capacitor is
recommended.
The input pin of regulator. Typically a large storage capacitor (0.05 ? ≤ ESR ≤ 0.5 ? ) is connected from
V IN
I
3
this pin to ground to ensure that the input voltage does not sag below the minimum dropout voltage
during the load transient response. This pin must always be 1.3V higher than V OUT in order for the
device to regulate properly.
Absolute Maximum Ratings (@T A = +25°C, unless otherwise specified.)
Symbol
V IN
T J
T ST
Parameter
Input Supply Voltage (Relative to Ground)
Junction Temperature
Power Dissipation
Storage Temperature
Rating
-0.03 to +18
+150
See SOA Curve
-65 to +150
Unit
V
°C
°C
Unless otherwise stated voltages specified are relative to the ANODE pin.
1.2
1
0.8
0.6
SOA
0.4
0.2
0
0
5
10 15
20
25
V IN - V OUT (V)
Safe Operation Area (SOA) Curve
ESD Susceptibility
HBM
MM
Symbol
Human Body Model
Machine Model
Parameter
Rating
4
400
Unit
kV
V
Stresses greater than the 'Absolute Maximum Ratings' specified above, may cause permanent damage to the device. These are stress ratings only; functional
operation of the device at these or any other conditions exceeding those indicated in this specification is not implied. Device reliability may be affected by exposure to
absolute maximum rating conditions for extended periods of time.
Semiconductor devices are ESD sensitive and may be damaged by exposure to ESD events. Suitable ESD precautions should be taken when handling and
transporting these devices
ZLDO1117
Document number: DS32018 Rev. 6 - 2
2 of 14
July 2012
? Diodes Incorporated
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