参数资料
型号: 4431-T-B1 D 470
厂商: Silicon Laboratories Inc
文件页数: 9/47页
文件大小: 799K
描述: KIT DEV TEST EZRADIOPRO SI4431
标准包装: 1
附件类型: 测试卡,收发器,470MHz
适用于相关产品: EZRadioPRO?
Si4430/31/32-B1
Rev 1.1
9
Table 3. Receiver AC Electrical Characteristics
1
Parameter
Symbol
Conditions
Min
Typ
Max   Units
RX Frequency
RangeSi4431/32
F
RX
240

930    MHz
RX Frequency
RangeSi4430
F
RX
900

960    MHz
RX Sensitivity
2
P
RX_2
(BER < 0.1%)
(2 kbps, GFSK, BT = 0.5,
Df = ? kHz)
3

121

dBm
P
RX_40
(BER < 0.1%)
(40 kbps, GFSK, BT = 0.5,
Df = ?0 kHz)
3

108

dBm
P
RX_100
(BER < 0.1%)
(100 kbps, GFSK, BT = 0.5,
Df = ?0 kHz)
3

104

dBm
P
RX_125
(BER < 0.1%)
(125 kbps, GFSK, BT = 0.5,
Df = ?2.5 kHz)

101

dBm
P
RX_OOK
(BER < 0.1%)
(4.8 kbps, 350 kHz BW, OOK)
3

110

dBm
(BER < 0.1%)
(40 kbps, 400 kHz BW, OOK)
3

102

dBm
RX Channel Bandwidth
3
BW
2.6

620
kHz
BER Variation vs Power
Level
3
P
RX_RES
Up to +5 dBm Input Level

0
0.1
ppm
LNA Input Impedance
3
(Unmatchedmeasured
differentially across RX
input pins)
R
IN-RX
915 MHz

5160j

W
868 MHz

5463j

433 MHz
    89110j    
315 MHz
    107137j    
RSSI Resolution
RES
RSSI

?.5

dB
?-Ch Offset Selectivity
3
C/I
1-CH
Desired Ref Signal 3 dB above sensitivity,
BER < 0.1%. Interferer and desired modu-
lated with 40 kbps DF = 20 kHz GFSK with
BT = 0.5, channel spacing = 150 kHz

31

dB
?-Ch Offset Selectivity
3
C/I
2-CH

35

dB
??-Ch Offset Selectivity
3
C/I
3-CH

40

dB
Blocking at 1 MHz Offset
3
1M
BLOCK
Desired Ref Signal 3 dB above sensitivity.
Interferer and desired modulated with
40 kbps DF = 20 kHz GFSK with BT = 0.5

52

dB
Blocking at 4 MHz Offset
3
4M
BLOCK

56

dB
Blocking at 8 MHz Offset
3
8M
BLOCK

63

dB
Image Rejection
3
Im
REJ
Rejection at the image frequency.
IF=937 kHz

30

dB
Spurious Emissions
3
P
OB_RX1
Measured at RX pins


54    dBm
Notes:
1.  All specification guaranteed by production test unless otherwise noted. Production test conditions and max limits are listed 
in the "Production Test Conditions" section on page 14.
2. Receive sensitivity at multiples of 30 MHz may be degraded. If channels with a multiple of 30 MHz are required it is 
recommended to shift the crystal frequency. Contact Silicon Labs Applications Support for recommendations.
3. Guaranteed by qualification. Qualification test conditions are listed in the "Production Test Conditions" section on page 14.
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