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| 型号： | 4431-T-B1 D 470 |
| 厂商： | Silicon Laboratories Inc |
| 文件页数： | 9/47页 |
| 文件大小： | 799K |
| 描述： | KIT DEV TEST EZRADIOPRO SI4431 |
| 标准包装： | 1 |
| 附件类型： | 测试卡，收发器，470MHz |
| 适用于相关产品： | EZRadioPRO? |
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Si4430/31/32-B1
Rev 1.1
9
Table 3. Receiver AC Electrical Characteristics
1
Parameter
Symbol
Conditions
Min
Typ
Max Units
RX Frequency
RangeSi4431/32
F
RX
240
930 MHz
RX Frequency
RangeSi4430
F
RX
900
960 MHz
RX Sensitivity
2
P
RX_2
(BER < 0.1%)
(2 kbps, GFSK, BT = 0.5,
Df = ? kHz)
3
121
dBm
P
RX_40
(BER < 0.1%)
(40 kbps, GFSK, BT = 0.5,
Df = ?0 kHz)
3
108
dBm
P
RX_100
(BER < 0.1%)
(100 kbps, GFSK, BT = 0.5,
Df = ?0 kHz)
3
104
dBm
P
RX_125
(BER < 0.1%)
(125 kbps, GFSK, BT = 0.5,
Df = ?2.5 kHz)
101
dBm
P
RX_OOK
(BER < 0.1%)
(4.8 kbps, 350 kHz BW, OOK)
3
110
dBm
(BER < 0.1%)
(40 kbps, 400 kHz BW, OOK)
3
102
dBm
RX Channel Bandwidth
3
BW
2.6
620
kHz
BER Variation vs Power
Level
3
P
RX_RES
Up to +5 dBm Input Level
0
0.1
ppm
LNA Input Impedance
3
(Unmatchedmeasured
differentially across RX
input pins)
R
IN-RX
915 MHz
5160j
W
868 MHz
5463j
433 MHz
89110j
315 MHz
107137j
RSSI Resolution
RES
RSSI
?.5
dB
?-Ch Offset Selectivity
3
C/I
1-CH
Desired Ref Signal 3 dB above sensitivity,
BER < 0.1%. Interferer and desired modu-
lated with 40 kbps DF = 20 kHz GFSK with
BT = 0.5, channel spacing = 150 kHz
31
dB
?-Ch Offset Selectivity
3
C/I
2-CH
35
dB
??-Ch Offset Selectivity
3
C/I
3-CH
40
dB
Blocking at 1 MHz Offset
3
1M
BLOCK
Desired Ref Signal 3 dB above sensitivity.
Interferer and desired modulated with
40 kbps DF = 20 kHz GFSK with BT = 0.5
52
dB
Blocking at 4 MHz Offset
3
4M
BLOCK
56
dB
Blocking at 8 MHz Offset
3
8M
BLOCK
63
dB
Image Rejection
3
Im
REJ
Rejection at the image frequency.
IF=937 kHz
30
dB
Spurious Emissions
3
P
OB_RX1
Measured at RX pins
54 dBm
Notes:
1. All specification guaranteed by production test unless otherwise noted. Production test conditions and max limits are listed
in the "Production Test Conditions" section on page 14.
2. Receive sensitivity at multiples of 30 MHz may be degraded. If channels with a multiple of 30 MHz are required it is
recommended to shift the crystal frequency. Contact Silicon Labs Applications Support for recommendations.
3. Guaranteed by qualification. Qualification test conditions are listed in the "Production Test Conditions" section on page 14.
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