参数资料
型号: 4463-TCE27F868-EK
厂商: Silicon Laboratories Inc
文件页数: 11/56页
文件大小: 0K
描述: KIT EZRADIO TEST CARD SI4463 TX
设计资源: 4463-TCE27F868 BOM
4463-TCE27F868 PCB
4463-TCE27F868 SCH
标准包装: 1
系列: EZRadioPRO®
类型: 收发器,ISM
频率: 868MHz
适用于相关产品: Si4463
已供物品:
Si4464/63/61/60
Table 5. Auxiliary Block Specifications 1
Parameter
Temperature Sensor
Sensitivity 2
Symbol
TS S
Test Condition
Min
Typ
4.5
Max
Unit
ADC
Codes/
°C
Low Battery Detector
LBD RES
50
mV
Resolution
Microcontroller Clock
Output Frequency Range 3
F MC
Configurable to Fxtal or Fxtal
divided by 2, 3, 7.5, 10, 15, or
32.768K
Fxtal
Hz
30 where Fxtal is the reference
XTAL frequency. In addition,
32.768 kHz is also supported.
Temperature Sensor
Conversion 2
XTAL Range 4
30 MHz XTAL Start-Up Time
TEMP CT
XTAL Range
t 30M
Programmable setting
Using XTAL and board layout in
25
3
250
32
ms
MHz
μs
reference design. Start-up time
will vary with XTAL type and
board layout.
30 MHz XTAL Cap
Resolution 2
32 kHz XTAL Start-Up Time 2
32 kHz Accuracy using
Internal RC Oscillator 2
POR Reset Time
30M RES
t 32k
32KRC RES
t POR
70
2
2500
5
fF
sec
ppm
ms
Notes:
1. All specification guaranteed by production test unless otherwise noted. Production test conditions and max limits are
listed in the "Production Test Conditions" section in "1.1. Definition of Test Conditions" on page 14.
2. Guaranteed by qualification. Qualification test conditions are listed in the "Qualification Test Conditions" section in "1.1.
Definition of Test Conditions" on page 14.
3. Microcontroller clock frequency tested in production at 1 MHz, 30 MHz and 32.768 kHz. Other frequencies tested in
bench characterization.
4. XTAL Range tested in production using an external clock source (similar to using a TCXO).
Rev 1.2
11
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