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| 型号： | 74LVTH182512DGGRG4 |
| 厂商： | TEXAS INSTRUMENTS INC |
| 元件分类： | 总线收发器 |
| 英文描述： | LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO64 |
| 封装： | GREEN, PLASTIC, TSSOP-64 |
| 文件页数： | 16/38页 |
| 文件大小： | 735K |
| 代理商： | 74LVTH182512DGGRG4 |
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SN54LVTH18512, SN54LVTH182512, SN74LVTH18512, SN74LVTH182512
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS671B – AUGUST 1996 – REVISED OCTOBER 1997
23
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
timing description
All test operations of the ’LVTH18512 and ’LVTH182512 are synchronous to the TCK signal. Data on the TDI,
TMS, and normal-function inputs is captured on the rising edge of TCK. Data appears on the TDO and
normal-function output pins on the falling edge of TCK. The TAP controller is advanced through its states (as
shown in Figure 1) by changing the value of TMS on the falling edge of TCK and then applying a rising edge
to TCK.
A simple timing example is shown in Figure 13. In this example, the TAP controller begins in the
Test-Logic-Reset state and is advanced through its states, as necessary, to perform one instruction-register
scan and one data-register scan. While in the Shift-IR and Shift-DR states, TDI is used to input serial data, and
TDO is used to output serial data. The TAP controller is then returned to the Test-Logic-Reset state. Table 5
details the operation of the test circuitry during each TCK cycle.
Table 5. Explanation of Timing Example
TCK
CYCLE(S)
TAP STATE
AFTER TCK
DESCRIPTION
1
Test-Logic-Reset
TMS is changed to a logic 0 value on the falling edge of TCK to begin advancing the TAP controller toward
the desired state.
2
Run-Test/Idle
3
Select-DR-Scan
4
Select-IR-Scan
5
Capture-IR
The IR captures the 8-bit binary value 10000001 on the rising edge of TCK as the TAP controller exits the
Capture-IR state.
6
Shift-IR
TDO becomes active and TDI is made valid on the falling edge of TCK. The first bit is shifted into the TAP
on the rising edge of TCK as the TAP controller advances to the next state.
7–13
Shift-IR
One bit is shifted into the IR on each TCK rising edge. With TDI held at a logic 1 value, the 8-bit binary value
11111111 is serially scanned into the IR. At the same time, the 8-bit binary value 10000001 is serially scanned
out of the IR via TDO. In TCK cycle 13, TMS is changed to a logic 1 value to end the IR scan on the next
TCK cycle. The last bit of the instruction is shifted as the TAP controller advances from Shift-IR to Exit1-IR.
14
Exit1-IR
TDO becomes inactive (goes to the high-impedance state) on the falling edge of TCK.
15
Update-IR
The IR is updated with the new instruction (BYPASS) on the falling edge of TCK.
16
Select-DR-Scan
17
Capture-DR
The bypass register captures a logic 0 value on the rising edge of TCK as the TAP controller exits the
Capture-DR state.
18
Shift-DR
TDO becomes active and TDI is made valid on the falling edge of TCK. The first bit is shifted into the TAP
on the rising edge of TCK as the TAP controller advances to the next state.
19–20
Shift-DR
The binary value 101 is shifted in via TDI, while the binary value 010 is shifted out via TDO.
21
Exit1-DR
TDO becomes inactive (goes to the high-impedance state) on the falling edge of TCK.
22
Update-DR
The selected data register is updated with the new data on the falling edge of TCK.
23
Select-DR-Scan
24
Select-IR-Scan
25
Test-Logic-Reset
Test operation completed
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相关代理商/技术参数 |
参数描述 |
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| 74LVTH182646APMG4 | 功能描述:特定功能逻辑 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| 74LVTH182652APMG4 | 功能描述:特定功能逻辑 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| 74LVTH18502APMRG4 | 功能描述:特定功能逻辑 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| 74LVTH18504APMRG4 | 功能描述:特定功能逻辑 3.3V ABT Scan Test Devices RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| 74LVTH18511DGGRE4 | 功能描述:总线收发器 3.3V ABT 18-BIT Univ Bus Transceiver RoHS:否 制造商:Fairchild Semiconductor 逻辑类型:CMOS 逻辑系列:74VCX 每芯片的通道数量:16 输入电平:CMOS 输出电平:CMOS 输出类型:3-State 高电平输出电流:- 24 mA 低电平输出电流:24 mA 传播延迟时间:6.2 ns 电源电压-最大:2.7 V, 3.6 V 电源电压-最小:1.65 V, 2.3 V 最大工作温度:+ 85 C 封装 / 箱体:TSSOP-48 封装:Reel |
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