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参数资料
| 型号： | 7525 |
| 厂商： | Toshiba Corporation |
| 英文描述： | X-ray Thickness Gage |
| 中文描述： | X射线测厚仪 |
| 文件页数： | 7/14页 |
| 文件大小： | 204K |
| 代理商： | 7525 |
No. EJD-069
7
Output Specifications
1.
Standard Specifications
Item
Analog deviation output (
μ
mor %) For control
Standard Specifications
Special Order Specifications
For control
± 10V/ max. deviation range
For indicator/for recorder
± 10V/ each deviation range
Remarks
1 insulated output
(AGC/purchaser's computer, etc.)
4 to 20 mA/maximumdeviation
range
AND conditions shown below:
X-ray ON
Shutter open
Not test mode
Not initial mode
Automatic mode
Open collector output
Displayed on operation-PC
Gage healthy (HEL) output
AND conditions for standard
specifications and user
specifications
Self-diagnostics
Printer output fromoperation-PC
2.
Optional Specifications
PI/O input and output in addition to the standard specifications listed above is possible by installing an
interface with an optional configuration.
Item
Settings
Thickness
Compensation
Strip width
Standard Specifications
BCD 1 system
Open collector
Maximumload
24V DC, 50mA
(1) Status output
*Abnormal
*Warning
Open collector
Maximumload
24V DC, 50mA
Special Order Specifications
BCD 1 system
No-voltage relay contact
Maximumload
48V DC, 0.1A
(1) Code output
BCD 3 digits
(2) Status output
*Unmeasurable
*Full calibration request
Both (1) and (2) open colletor or
no-voltage relay contact
14-bit binary output with +/- sign
± 16000 maximumdeviation
range
Open collector output
Maximumload
24V DC, 50mA
Max. 6 digits
.
Open collector output
Maximumload
24V DC, 50mA
Remarks
Self-diagnostics
Digital deviation output
None
Output period 0.01 second
Digital absolute output
None
mm
Output period 1 second
Can be changed in 0.01
second increments
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