- 您现在的位置：买卖IC网 > PDF目录164976 > A40MX04-PQ100AX79 FPGA, 547 CLBS, 6000 GATES, 116 MHz, PQFP100 PDF资料下载
参数资料
| 型号： | A40MX04-PQ100AX79 |
| 元件分类： | FPGA |
| 英文描述： | FPGA, 547 CLBS, 6000 GATES, 116 MHz, PQFP100 |
| 封装： | PLASTIC, QFP-100 |
| 文件页数： | 34/124页 |
| 文件大小： | 3142K |
| 代理商： | A40MX04-PQ100AX79 |
第1页第2页第3页第4页第5页第6页第7页第8页第9页第10页第11页第12页第13页第14页第15页第16页第17页第18页第19页第20页第21页第22页第23页第24页第25页第26页第27页第28页第29页第30页第31页第32页第33页当前第34页第35页第36页第37页第38页第39页第40页第41页第42页第43页第44页第45页第46页第47页第48页第49页第50页第51页第52页第53页第54页第55页第56页第57页第58页第59页第60页第61页第62页第63页第64页第65页第66页第67页第68页第69页第70页第71页第72页第73页第74页第75页第76页第77页第78页第79页第80页第81页第82页第83页第84页第85页第86页第87页第88页第89页第90页第91页第92页第93页第94页第95页第96页第97页第98页第99页第100页第101页第102页第103页第104页第105页第106页第107页第108页第109页第110页第111页第112页第113页第114页第115页第116页第117页第118页第119页第120页第121页第122页第123页第124页
40MX and 42MX FPGA Families
v6.1
1-11
Each I/O cell has three boundary-scan register cells, each
with a serial-in, serial-out, parallel-in, and parallel-out
pin. The serial pins are used to serially connect all the
boundary-scan register cells in a device into a boundary-
scan register chain, which starts at the TDI pin and ends
at the TDO pin. The parallel ports are connected to the
internal core logic tile and the input, output and control
ports of an I/O buffer to capture and load data into the
register to control or observe the logic state of each I/O.
Figure 1-14 42MX IEEE 1149.1 Boundary Scan Circuitry
Table 3
Test Access Port Descriptions
Port
Description
TMS
(Test
Mode
Select)
Serial input for the test logic control bits. Data is captured on the rising edge of the test logic clock (TCK).
TCK (Test Clock Input) Dedicated test logic clock used serially to shift test instruction, test data, and control inputs on the rising edge
of the clock, and serially to shift the output data on the falling edge of the clock. The maximum clock frequency
for TCK is 20 MHz.
TDI (Test Data Input)
Serial input for instruction and test data. Data is captured on the rising edge of the test logic clock.
TDO
(Test
Data
Output)
Serial output for test instruction and data from the test logic. TDO is set to an Inactive Drive state (high
impedance) when data scanning is not in progress.
Table 4
Supported BST Public Instructions
Instruction
IR Code (IR2.IR0)
Instruction Type
Description
EXTEST
000
Mandatory
Allows the external circuitry and board-level interconnections to
be tested by forcing a test pattern at the output pins and
capturing test results at the input pins.
SAMPLE/PRELOAD
001
Mandatory
Allows a snapshot of the signals at the device pins to be
captured and examined during operation
HIGH Z
101
Optional
Tristates all I/Os to allow external signals to drive pins. Please
refer to the IEEE Standard 1149.1 specification.
CLAMP
110
Optional
Allows state of signals driven from component pins to be
determined from the Boundary-Scan Register. Please refer to
the IEEE Standard 1149.1 specification for details.
BYPASS
111
Mandatory
Enables the bypass register between the TDI and TDO pins. The
test data passes through the selected device to adjacent devices
in the test chain.
Boundary Scan Register
Instruction
Decode
Control Logic
TAP Controller
Instruction
Register
Bypass
Register
TMS
TCK
TDI
Output
MUX
TDO
JTAG
相关PDF资料 |
PDF描述 |
|---|---|
| A40MX04-PQ100A | FPGA, 547 CLBS, 6000 GATES, 116 MHz, PQFP100 |
| A40MX04-PQ100IX79 | FPGA, 547 CLBS, 6000 GATES, 80 MHz, PQFP100 |
| A40MX04-PQ100I | FPGA, 547 CLBS, 6000 GATES, 80 MHz, PQFP100 |
| A40MX04-PQ100MX79 | FPGA, 547 CLBS, 6000 GATES, 80 MHz, PQFP100 |
| A40MX04-PQ100M | FPGA, 547 CLBS, 6000 GATES, 80 MHz, PQFP100 |
相关代理商/技术参数 |
参数描述 |
|---|---|
| A40MX04-PQ100ES | 制造商:ACTEL 制造商全称:Actel Corporation 功能描述:40MX and 42MX FPGA Families |
| A40MX04-PQ100I | 功能描述:IC FPGA MX SGL CHIP 6K 100-PQFP RoHS:否 类别:集成电路 (IC) >> 嵌入式 - FPGA（现场可编程门阵列） 系列:MX 标准包装:90 系列:ProASIC3 LAB/CLB数:- 逻辑元件/单元数:- RAM 位总计:36864 输入/输出数:157 门数:250000 电源电压:1.425 V ~ 1.575 V 安装类型:表面贴装 工作温度:-40°C ~ 125°C 封装/外壳:256-LBGA 供应商设备封装:256-FPBGA（17x17） |
| A40MX04-PQ100M | 制造商:Microsemi Corporation 功能描述:FPGA 40MX Family 6K Gates 547 Cells 83MHz/139MHz 0.45um Technology 3.3V/5V 100-Pin PQFP 制造商:Microsemi Corporation 功能描述:FPGA 6K GATES 547 CELLS 83MHZ/139MHZ 0.45UM 3.3V/5V 100PQFP - Trays 制造商:Microsemi SOC Products Group 功能描述:83MHZ/139MHZ 0.45UM TECHNOLOGY 3.3V/5V 制造商:Microsemi Corporation 功能描述:IC FPGA MX SGL CHIP 6K 100-PQFP |
| A40MX04-PQ208A | 制造商:ACTEL 制造商全称:Actel Corporation 功能描述:40MX and 42MX Automotive FPGA Families |
| A40MX04PQG100 | 制造商:Microsemi SOC Products Group 功能描述: |
发布紧急采购，3分钟左右您将得到回复。