参数资料
| 型号： | A54SX32A-TQ176I |
| 厂商： | Microsemi SoC |
| 文件页数： | 16/108页 |
| 文件大小： | 0K |
| 描述： | IC FPGA SX 48K GATES 176-TQFP |
| 标准包装： | 40 |
| 系列： | SX-A |
| LAB/CLB数： | 2880 |
| 输入/输出数： | 147 |
| 门数： | 48000 |
| 电源电压： | 2.25 V ~ 5.25 V |
| 安装类型： | 表面贴装 |
| 工作温度： | -40°C ~ 85°C |
| 封装/外壳： | 176-LQFP |
| 供应商设备封装： | 176-TQFP（24x24） |
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SX-A Family FPGAs
v5.3
1-11
Probing Capabilities
SX-A devices also provide an internal probing capability
that is accessed with the JTAG pins. The Silicon Explorer II
diagnostic hardware is used to control the TDI, TCK, TMS,
and TDO pins to select the desired nets for debugging.
The user assigns the selected internal nets in Actel Silicon
Explorer II software to the PRA/PRB output pins for
observation. Silicon Explorer II automatically places the
device into JTAG mode. However, probing functionality is
only activated when the TRST pin is driven high or left
floating, allowing the internal pull-up resistor to pull
TRST High. If the TRST pin is held Low, the TAP controller
remains in the Test-Logic-Reset state so no probing can
be performed. However, the user must drive the TRST pin
High or allow the internal pull-up resistor to pull TRST
High.
When selecting the Reserve Probe Pin box as shown in
Figure 1-12 on page 1-9, direct the layout tool to reserve
the PRA and PRB pins as dedicated outputs for probing.
This Reserve option is merely a guideline. If the designer
assigns user I/Os to the PRA and PRB pins and selects the
Reserve
Probe
Pin option, Designer Layout will
override the Reserve Probe Pin option and place the
user I/Os on those pins.
To allow probing capabilities, the security fuse must not
be programmed. Programming the security fuse disables
the JTAG and probe circuitry. Table 1-9 summarizes the
possible device configurations for probing once the
device leaves the Test-Logic-Reset JTAG state.
Table 1-9 Device Configuration Options for Probe Capability (TRST Pin Reserved)
JTAG Mode
TRST1
Security Fuse Programmed
PRA, PRB2
TDI, TCK, TDO2
Dedicated
Low
No
User I/O3
JTAG Disabled
High
No
Probe Circuit Outputs
JTAG I/O
Flexible
Low
No
User I/O3
High
No
Probe Circuit Outputs
JTAG I/O
Yes
Probe Circuit Secured
Notes:
1. If the TRST pin is not reserved, the device behaves according to TRST = High as described in the table.
2. Avoid using the TDI, TCK, TDO, PRA, and PRB pins as input or bidirectional ports. Since these pins are active during probing, input
signals will not pass through these pins and may cause contention.
3. If no user signal is assigned to these pins, they will behave as unused I/Os in this mode. Unused pins are automatically tristated by
the Designer software.
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相关代理商/技术参数 |
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| A54SX32A-TQ176M | 制造商:Microsemi Corporation 功能描述:FPGA SX-A 32K GATES 1800 CELLS 238MHZ 0.25UM/0.22UM 2.5V 176 - Trays 制造商:Microsemi Corporation 功能描述:IC FPGA 147 I/O 176TQFP 制造商:Microsemi Corporation 功能描述:IC FPGA 48K GATES 176TQFP |
| A54SX32A-TQG100 | 功能描述:IC FPGA 249I/O 100TQFP RoHS:是 类别:集成电路 (IC) >> 嵌入式 - FPGA（现场可编程门阵列） 系列:SX-A 标准包装:24 系列:ECP2 LAB/CLB数:1500 逻辑元件/单元数:12000 RAM 位总计:226304 输入/输出数:131 门数:- 电源电压:1.14 V ~ 1.26 V 安装类型:表面贴装 工作温度:0°C ~ 85°C 封装/外壳:208-BFQFP 供应商设备封装:208-PQFP（28x28） |
| A54SX32A-TQG100A | 功能描述:IC FPGA SX 48K GATES 100-TQFP RoHS:是 类别:集成电路 (IC) >> 嵌入式 - FPGA（现场可编程门阵列） 系列:SX-A 标准包装:40 系列:SX-A LAB/CLB数:6036 逻辑元件/单元数:- RAM 位总计:- 输入/输出数:360 门数:108000 电源电压:2.25 V ~ 5.25 V 安装类型:表面贴装 工作温度:0°C ~ 70°C 封装/外壳:484-BGA 供应商设备封装:484-FPBGA（27X27） |
| A54SX32A-TQG100I | 功能描述:IC FPGA SX 48K GATES 100-TQFP RoHS:是 类别:集成电路 (IC) >> 嵌入式 - FPGA（现场可编程门阵列） 系列:SX-A 标准包装:40 系列:SX-A LAB/CLB数:6036 逻辑元件/单元数:- RAM 位总计:- 输入/输出数:360 门数:108000 电源电压:2.25 V ~ 5.25 V 安装类型:表面贴装 工作温度:0°C ~ 70°C 封装/外壳:484-BGA 供应商设备封装:484-FPBGA（27X27） |
| A54SX32A-TQG100M | 制造商:Microsemi Corporation 功能描述:FPGA SX-A Family 32K Gates 1800 Cells 238MHz 0.25um Technology 2.5V 100-Pin TQFP 制造商:Microsemi Corporation 功能描述:FPGA SX-A 32K GATES 1800 CELLS 238MHZ 0.25UM/0.22UM 2.5V 100 - Trays |
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