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参数资料
| 型号： | AD5060YRJZ-1REEL7 |
| 厂商： | Analog Devices Inc |
| 文件页数： | 6/24页 |
| 文件大小： | 0K |
| 描述： | IC DAC 16BIT SPI/SRL SOT23-8 |
| 产品培训模块： | DAC Architectures |
| 标准包装： | 1 |
| 系列： | nanoDAC™ |
| 设置时间： | 4µs |
| 位数： | 16 |
| 数据接口： | DSP，MICROWIRE?，QSPI?，串行，SPI? |
| 转换器数目： | 1 |
| 电压电源： | 单电源 |
| 功率耗散（最大）： | 6mW |
| 工作温度： | -40°C ~ 125°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | SOT-23-8 |
| 供应商设备封装： | SOT-23-8 |
| 包装： | 标准包装 |
| 输出数目和类型： | 1 电压，单极；1 电压，双极 |
| 采样率（每秒）： | 250k |
| 产品目录页面： | 781 (CN2011-ZH PDF) |
| 其它名称： | AD5060YRJZ-1REEL7DKR |
AD5040/AD5060
Rev. A | Page 14 of 24
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy or integral nonlinearity (INL) is
a measure of the maximum deviation, in LSBs, from a straight
line passing through the endpoints of the DAC transfer
function. A typical AD5060 INL vs. code plot is shown in
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±1 LSB maximum
ensures monotonicity. This DAC is guaranteed monotonic by
design. A typical AD5060 DNL vs. code plot is shown in Figure 5.
Offset Error
Offset error is a measure of the output error when zero code
(0x0000) is loaded to the DAC register. Ideally, the output
should be 0 V. The zero-code error is always positive in the
AD5040/AD5060 because the output of the DAC cannot go
below 0 V. This is due to a combination of the offset errors in
the DAC and output amplifier. Zero-code error is expressed
in mV.
Full-Scale Error
Full-scale error is a measure of the output error when full-scale
code (0xFFFF AD5060, 0x3FFF AD5040) is loaded to the DAC
register. Ideally, the output should be VDD 1 LSB. Full-scale
error is expressed in percent of full-scale range.
Gain Error
This is a measure of the span error of the DAC. It is the devia-
tion in slope of the DAC transfer characteristic from ideal,
expressed as a percent of the full-scale range.
Total Unadjusted Error (TUE)
Total unadjusted error is a measure of the output error taking
all the various errors into account. A typical AD5060 TUE vs.
code plot is shown in Figure 6.
Offset Error Drift
This is a measure of the change in zero-code error with a
change in temperature. It is expressed in μV/°C.
Gain Error Drift
This is a measure of the change in gain error with changes in
temperature. It is expressed in (ppm of full-scale range)/°C.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-s
and is measured when the digital input code is changed by
The expanded view in Figure 23 shows the glitch generated
following completion of the calibration routine; Figure 24
zooms in on this glitch.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital inputs of the
DAC, but is measured when the DAC output is not updated. It
is specified in nV-s and measured with a full-scale code change
on the data bus—that is, from all 0s to all 1s, and vice versa.
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| AD5061BRJZ-1500RL7 | 功能描述:IC DAC 16BIT SPI/SRL SOT23-8 RoHS:是 类别:集成电路 (IC) >> 数据采集 - 数模转换器 系列:nanoDAC™ 产品培训模块:LTC263x 12-, 10-, and 8-Bit VOUT DAC Family 特色产品:LTC2636 - Octal 12-/10-/8-Bit SPI VOUT DACs with 10ppm/°C Reference 标准包装:91 系列:- 设置时间:4µs 位数:10 数据接口:MICROWIRE?，串行，SPI? 转换器数目:8 电压电源:单电源 功率耗散（最大）:2.7mW 工作温度:-40°C ~ 85°C 安装类型:表面贴装 封装/外壳:14-WFDFN 裸露焊盘 供应商设备封装:14-DFN-EP（4x3） 包装:管件 输出数目和类型:8 电压，单极 采样率（每秒）:* |
| AD5061BRJZ-1REEL7 | 功能描述:IC DAC 16BIT SPI/SRL SOT23-8 RoHS:是 类别:集成电路 (IC) >> 数据采集 - 数模转换器 系列:nanoDAC™ 产品培训模块:LTC263x 12-, 10-, and 8-Bit VOUT DAC Family 特色产品:LTC2636 - Octal 12-/10-/8-Bit SPI VOUT DACs with 10ppm/°C Reference 标准包装:91 系列:- 设置时间:4µs 位数:10 数据接口:MICROWIRE?，串行，SPI? 转换器数目:8 电压电源:单电源 功率耗散（最大）:2.7mW 工作温度:-40°C ~ 85°C 安装类型:表面贴装 封装/外壳:14-WFDFN 裸露焊盘 供应商设备封装:14-DFN-EP（4x3） 包装:管件 输出数目和类型:8 电压，单极 采样率（每秒）:* |
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