参数资料
| 型号： | AD5361BCPZ |
| 厂商： | Analog Devices Inc |
| 文件页数： | 7/29页 |
| 文件大小： | 0K |
| 描述： | IC DAC 14BIT 16CH SERIAL 56LFCSP |
| 产品培训模块： | Data Converter Fundamentals DAC Architectures |
| 标准包装： | 1 |
| 设置时间： | 20µs |
| 位数： | 14 |
| 数据接口： | 串行 |
| 转换器数目： | 16 |
| 电压电源： | 双 ± |
| 功率耗散（最大）： | 245mW |
| 工作温度： | -40°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 56-VFQFN 裸露焊盘，CSP |
| 供应商设备封装： | 56-LFCSP-VQ（8x8） |
| 包装： | 托盘 |
| 输出数目和类型： | 16 电压，单极；16 电压，双极 |
| 采样率（每秒）： | * |
| 配用： | EVAL-AD5361EBZ-ND - BOARD EVAL FOR AD5361 |
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AD5360/AD5361
Rev. A | Page 14 of 28
TERMINOLOGY
Integral Nonlinearity (INL)
Integral nonlinearity, or relative accuracy, is a measure of the
maximum deviation from a straight line passing through the
endpoints of the DAC transfer function. It is measured after
adjusting for zero-scale error and full-scale error and is
expressed in least significant bits (LSB).
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of 1 LSB maximum
ensures monotonicity.
Zero-Scale Error
Zero-scale error is the error in the DAC output voltage when all
0s are loaded into the DAC register.
Zero-scale error is a measure of the difference between VOUT
(actual) and VOUT (ideal), expressed in millivolts, when the
channel is at its minimum value. Zero-scale error is mainly due
to offsets in the output amplifier.
Full-Scale Error
Full-scale error is the error in DAC output voltage when all 1s
are loaded into the DAC register.
Full-scale error is a measure of the difference between VOUT
(actual) and VOUT (ideal), expressed in millivolts, when
the channel is at its maximum value. It does not include zero-
scale error.
Gain Error
Gain error is the difference between full-scale error and zero-
scale error. It is expressed in millivolts.
Gain Error = Full-Scale Error Zero-Scale Error
VOUT Temperature Coefficient
This includes output error contributions from linearity, offset,
and gain drift.
DC Output Impedance
DC output impedance is the effective output source resistance.
It is dominated by package lead resistance.
DC Crosstalk
The DAC outputs are buffered by op amps that share common
VDD and VSS power supplies. If the dc load current changes in
one channel (due to an update), this can result in a further dc
change in one or more channel outputs. This effect is more
significant at high load currents and reduces as the load
currents are reduced. With high impedance loads, the effect is
virtually immeasurable. Multiple VDD and VSS terminals are
provided to minimize dc crosstalk.
Output Voltage Settling Time
The amount of time it takes for the output of a DAC to settle to
a specified level for a full-scale input change.
Digital-to-Analog Glitch Energy
This is the amount of energy injected into the analog output at
the major code transition. It is specified as the area of the glitch
in nV-s. It is measured by toggling the DAC register data between
0x7FFF and 0x8000 (AD5360) or 0x1FFF and 0x2000 (AD5361).
Channel-to-Channel Isolation
Channel-to-channel isolation refers to the proportion of input
signal from the reference input of one DAC that appears at the
output of another DAC operating from another reference. It is
expressed in decibels and measured at midscale.
DAC-to-DAC Crosstalk
DAC-to-DAC crosstalk is the glitch impulse that appears at the
output of one converter due to both the digital change and
subsequent analog output change at another converter. It is
specified in nV-s.
Digital Crosstalk
Digital crosstalk is defined as the glitch impulse transferred to
the output of one converter due to a change in the DAC register
code of another converter and is specified in nV-s.
Digital Feedthrough
When the device is not selected, high frequency logic activity
on the device’s digital inputs can be capacitively coupled both
across and through the device to show up as noise on the
VOUTx pins. It can also be coupled along the supply and
ground lines. This noise is digital feedthrough.
Output Noise Spectral Density
Output noise spectral density is a measure of internally
generated random noise. Random noise is characterized as a
spectral density (voltage per √Hz). It is measured by loading all
DACs to midscale and measuring noise at the output. It is
measured in nV/√Hz.
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相关代理商/技术参数 |
参数描述 |
|---|---|
| AD5361BCPZ1 | 制造商:AD 制造商全称:Analog Devices 功能描述:16-Channel, 16-/14-Bit, Serial Input, Voltage-Output DAC |
| AD5361BCPZ-REEL7 | 功能描述:IC DAC 14BIT 16CH SERIAL 56LFCSP RoHS:是 类别:集成电路 (IC) >> 数据采集 - 数模转换器 系列:- 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:1,000 系列:- 设置时间:1µs 位数:8 数据接口:串行 转换器数目:8 电压电源:双 ± 功率耗散（最大）:941mW 工作温度:0°C ~ 70°C 安装类型:表面贴装 封装/外壳:24-SOIC（0.295"，7.50mm 宽） 供应商设备封装:24-SOIC W 包装:带卷 (TR) 输出数目和类型:8 电压，单极 采样率（每秒）:* |
| AD5361BCPZ-REEL71 | 制造商:AD 制造商全称:Analog Devices 功能描述:16-Channel, 16-/14-Bit, Serial Input, Voltage-Output DAC |
| AD5361BSTZ | 功能描述:IC DAC 14BIT 16CH SERIAL 56LQFP RoHS:是 类别:集成电路 (IC) >> 数据采集 - 数模转换器 系列:- 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:1,000 系列:- 设置时间:1µs 位数:8 数据接口:串行 转换器数目:8 电压电源:双 ± 功率耗散（最大）:941mW 工作温度:0°C ~ 70°C 安装类型:表面贴装 封装/外壳:24-SOIC（0.295"，7.50mm 宽） 供应商设备封装:24-SOIC W 包装:带卷 (TR) 输出数目和类型:8 电压，单极 采样率（每秒）:* |
| AD5361BSTZ1 | 制造商:AD 制造商全称:Analog Devices 功能描述:16-Channel, 16-/14-Bit, Serial Input, Voltage-Output DAC |
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