参数资料
| 型号： | AD766AN |
| 厂商： | Analog Devices Inc |
| 文件页数： | 6/8页 |
| 文件大小： | 0K |
| 描述： | IC DAC 16BIT W/REF DSP 16-DIP |
| 产品培训模块： | Data Converter Fundamentals DAC Architectures |
| 标准包装： | 1 |
| 系列： | DACPORT® |
| 设置时间： | 1.5µs |
| 位数： | 16 |
| 数据接口： | 串行 |
| 转换器数目： | 1 |
| 电压电源： | 模拟和数字，双 ± |
| 功率耗散（最大）： | 300mW |
| 工作温度： | 0°C ~ 70°C |
| 安装类型： | 通孔 |
| 封装/外壳： | 16-DIP（0.300"，7.62mm） |
| 供应商设备封装： | 16-PDIP |
| 包装： | 管件 |
| 输出数目和类型： | 2 电流，双极；2 电压，双极 |
| 采样率（每秒）： | 390k |
AD766
REV. A
–6–
system where only a single positive and a single negative supply
are available. In this case, the positive logic and positive analog
supplies may both be connected to the single positive supply.
The negative logic and negative analog supplies may both be
connected to the single negative supply. Performance would
benefit from a measure of isolation between the supplies intro-
duced by using simple low-pass filters in the individual power
supply leads.
Figure 6. Alternate Recommended Schematic
Figure 7. Power Dissipation vs. Clock Frequency
As with most linear circuits, changes in the power supplies will
affect the output of the DAC. Analog Devices recommends that
well regulated power supplies with less than 1% ripple be incor-
porated into the design of any system using these device.
MEASUREMENT OF TOTAL HARMONIC DISTORTION
The THD specification of a DSP DAC represents the amount
of undesirable signal produced during reconstruction of a digital
waveform. To account for the variety of operating conditions
Figure 8. Distortion Test Circuit
in signal processing applications, the DAC is tested at two
output frequencies and at three signal levels over the full oper-
ating temperature ranges.
A block diagram of the test setup is shown in Figure 8. In this
test setup, a digital data stream, representing a 0 dB, –20 dB or
–60 dB sine wave is sent to the device under test. The frequen-
cies used are 1037 Hz and 49.07 kHz. Input data is latched into
the AD766 at 500 kSPS. The AD766 under test produces an
analog output signal using the on-board op amp for 1 kHz and
an external op amp for 50 kHz.
The automatic test equipment digitizes the output test wave-
form, and then an FFT to 250 kHz is performed on the results
of the test. Based on the first 9 harmonics of the fundamental
1037 Hz and the first 3 harmonics of the 49.07 kHz output
waves, the total harmonic distortion of the device is calculated.
Neither a deglitcher nor an MSB trim is used during the THD
test.
The circuit design, layout and manufacturing techniques em-
ployed in the production of the AD766 result in excellent THD
performance. Figure 9 shows the typical unadjusted THD per-
formance of the AD766 for various amplitudes of 1 kHz and
50 kHz sine waves. As can be seen, the AD766 offers excellent
performance even at amplitudes as low as 60 dB. Figure 10
illustrates the typical THD versus frequency performance from
the internal amplifier for a filtered AD766 output. At frequen-
cies greater than approximately 30 kHz, depending on the low-
pass filter used, an improvement in THD of 3–4 dB over the
performance shown in the figure can be achieved. Figure 11
illustrates the consistent THD performance of the AD766
over temperature.
Figure 9. Typical Unadjusted THD
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| AD766ANZ | 功能描述:IC DAC 16BIT W/REF DSP 16-DIP RoHS:是 类别:集成电路 (IC) >> 数据采集 - 数模转换器 系列:DACPORT® 标准包装:1 系列:- 设置时间:4.5µs 位数:12 数据接口:串行，SPI? 转换器数目:1 电压电源:单电源 功率耗散（最大）:- 工作温度:-40°C ~ 125°C 安装类型:表面贴装 封装/外壳:8-SOIC（0.154"，3.90mm 宽） 供应商设备封装:8-SOICN 包装:剪切带 (CT) 输出数目和类型:1 电压，单极；1 电压，双极 采样率（每秒）:* 其它名称:MCP4921T-E/SNCTMCP4921T-E/SNRCTMCP4921T-E/SNRCT-ND |
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| AD766JNZ | 功能描述:IC DAC 16BIT W/VREF 16-DIP RoHS:是 类别:集成电路 (IC) >> 数据采集 - 数模转换器 系列:DACPORT® 标准包装:1 系列:- 设置时间:4.5µs 位数:12 数据接口:串行，SPI? 转换器数目:1 电压电源:单电源 功率耗散（最大）:- 工作温度:-40°C ~ 125°C 安装类型:表面贴装 封装/外壳:8-SOIC（0.154"，3.90mm 宽） 供应商设备封装:8-SOICN 包装:剪切带 (CT) 输出数目和类型:1 电压，单极；1 电压，双极 采样率（每秒）:* 其它名称:MCP4921T-E/SNCTMCP4921T-E/SNRCTMCP4921T-E/SNRCT-ND |
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