参数资料
型号: ADA4051-1ARJZ-R7
厂商: Analog Devices Inc
文件页数: 16/20页
文件大小: 0K
描述: IC OPAMP R-R CMOS 115KHZ SOT23-5
标准包装: 3,000
放大器类型: 断路器(零漂移)
电路数: 1
输出类型: 满摆幅
转换速率: 0.06 V/µs
增益带宽积: 125kHz
电流 - 输入偏压: 20pA
电压 - 输入偏移: 2µV
电流 - 电源: 15µA
电流 - 输出 / 通道: 15mA
电压 - 电源,单路/双路(±): 1.8 V ~ 5.5 V
工作温度: -40°C ~ 125°C
安装类型: 表面贴装
封装/外壳: SC-74A,SOT-753
供应商设备封装: SOT-23-5
包装: 带卷 (TR)
ADA4051-1/ADA4051-2
Rev. B | Page 5 of 20
ABSOLUTE MAXIMUM RATINGS
THERMAL RESISTANCE
Table 4.
Parameter
Rating
Supply Voltage
6 V
Input Voltage
±VSY ± 0.3 V
Input Current1
±10 mA
Differential Input Voltage2
±VSY
Output Short-Circuit Duration to GND
Indefinite
Storage Temperature Range
65°C to +150°C
Operating Temperature Range
40°C to +125°C
Junction Temperature Range
65°C to +150°C
Lead Temperature (Soldering, 60 sec)
300°C
θJA is specified for the worst-case conditions, that is, a device
soldered on a circuit board for surface-mount packages with its
exposed paddle soldered to a pad, if applicable. Table 5 shows
simulated thermal values for a 4-layer (2S2P) JEDEC standard
thermal test board, unless otherwise specified.
Table 5. Thermal Resistance
Package Type
θJA
θJC
Unit
5-Lead SOT-23 (RJ-5)
190
92
°C/W
5-Lead SC-70 (KS-5)
534
173
°C/W
8-Lead MSOP (RM-8)
142
45
°C/W
8-Lead LFCSP (CP-8-2)
77
14
°C/W
1 The input pins have clamp diodes to the power supply pins. Limit the input
current to 10 mA or less whenever input signals exceed the power supply
rail by 0.3 V.
POWER SEQUENCING
2 Inputs are protected against high differential voltages by internal series
1.33 kΩ resistors and back-to-back diode-connected N-MOSFETs (with a
typical VT of 0.7 V for VCM of 0 V).
The op amp supplies must be established simultaneously with
or before any input signals are applied. If this is not possible, the
input current must be limited to 10 mA.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
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