参数资料
型号: ADATE302-02BSVZ
厂商: Analog Devices Inc
文件页数: 13/58页
文件大小: 0K
描述: IC DCL ATE 500MHZ DUAL 100TQFP
标准包装: 1
类型: DCL
应用: 自动测试设备
安装类型: 表面贴装
封装/外壳: 100-TQFP 裸露焊盘
供应商设备封装: 100-TQFP-EP(14x14)
包装: 托盘
ADATE302-02
Rev. A | Page 20 of 58
ABSOLUTE MAXIMUM RATINGS
Table 14.
Parameter
Rating
Supply Voltages
Positive Supply Voltage (VDD to GND)
0.5 V to +11.0 V
Positive VCC Supply Voltage (VCC to GND)
0.5 V to +4.0 V
Negative Supply Voltage (VSS to GND)
6.25 V to +0.5 V
Supply Voltage Difference (VDD to VSS)
1.0 V to +16.5 V
Reference Ground (DUTGND to GND)
0.5 V to +0.5 V
AGND to DGND
0.5 V to +0.5 V
VPLUS Supply Voltage (VPLUS to GND)
0.5 V to +17.5 V
Input Voltages
Input Common-Mode Voltage
VSS to VDD
Short-Circuit Voltage1
3.0 V to +8.0 V
High Speed Input Voltage2
0 to VCC
High Speed Differential Input Voltage3
0 to VCC
VREF
0.5 V to +5.5 V
DUTx I/O Pin Current
DCL Maximum Short-Circuit Current4
±140 mA
Temperature
Operating Temperature, Junction
125°C
Storage Temperature Range
65°C to +150°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL RESISTANCE
Table 15. Thermal Resistance
Package Type
θJA
θJC
Unit
84-Ball CSP_BGA
31.1
0.51
°C/W
EXPLANATION OF TEST LEVELS
D
Definition
S
Design verification simulation
P
100% production tested
PF
Functionally checked during production test
CT
Characterized on tester
CB
Characterized on bench
1 RL = 0 Ω, VDUTx continuous short-circuit condition (VH, VL, VT, high-Z, VCOM,
clamp modes).
2 DATAxP, DATAxN, RCVxP, RCVxN, under source R = 0 Ω.
3 DATAxP to DATAxN, RCVxP, RCVxN.
4 RL = 0 Ω, VDUTx = 3 V to +8 V; DCL current limit. Continuous short-circuit
condition. ADATE302-02 must current limit and survive continuous short
circuit.
ESD CAUTION
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