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参数资料
| 型号： | ADC0811BCN |
| 厂商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分类： | ADC |
| 英文描述： | 8-Bit Serial I/O A/D Converter With 11-Channel Multiplexer |
| 中文描述： | 11-CH 8-BIT SUCCESSIVE APPROXIMATION ADC, SERIAL ACCESS, PDIP20 |
| 封装： | 0.300 INCH, PLASTIC, DIP-20 |
| 文件页数： | 4/14页 |
| 文件大小： | 323K |
| 代理商： | ADC0811BCN |
Electrical Characteristics
The following specifications apply for V
CC
e
4.75V to 5.25V, V
REF
e a
4.6V to (V
CC
a
0.1V),
w
2 CLK
e
2.097 MHz unless
otherwise specified.
Boldface limits apply from T
MIN
to T
MAX
;
all other limits T
A
e
T
J
e
25
§
C. (Continued)
Typical
(Note 6)
Tested
Limit
(Note 7)
Design
Limit
(Note 8)
Parameter
Conditions
Units
AC CHARACTERISTICS
(Continued)
t
SDI
, Minimum DI Set-up Time to S
CLK
Rising Edge
200
400
ns
t
DDO
, Maximum Delay From S
CLK
Falling Edge to DO Data Valid
R
L
e
30k,
C
L
e
100 pF
R
L
e
3k,
C
L
e
100 pF
180
400
400
ns
t
TRI
, Maximum DO Hold Time,
(CS Rising edge to DO
TRI-STATE)
90
150
150
ns
t
CA
, Analog
Sampling Time
After Address Is Latched
CS
e
Low
4/S
CLK
a
1
m
s
sec
t
RDO
, Maximum DO
R
L
e
30 k
X
,
C
L
e
100 pf
R
L
e
30 k
X
,
C
L
e
100 pf
‘‘TRI-STATE’’ to ‘‘HIGH’’ State
75
150
150
ns
Rise Time
‘‘LOW’’ to ‘‘HIGH’’ State
150
300
300
t
FDO
, Maximum DO
‘‘TRI-STATE’’ to ‘‘LOW’’ State
75
150
150
ns
Fall Time
‘‘HIGH’’ to ‘‘LOW’’ State
150
300
300
C
IN
, Maximum Input
Analog Inputs, ANO–AN10 and V
REF
11
55
pF
Capacitance
All Others
5
15
Note 1:
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not apply when operating
the device beyond its specified operating conditions.
Note 2:
All voltages are measured with respect to ground.
Note 3:
Under over voltage conditions (V
IN
k
0V and V
IN
l
V
CC
) the maximum input current at any one pin is
g
5 mA. If the voltage at more than one pin exceeds
V
CC
a
.3V the total package current must be limited to 20 mA. For example the maximum number of pins that can be over driven at the maximum current level of
g
5 mA is four.
Note 4:
Total unadjusted error includes offset, full-scale, linearity, multiplexer, and hold step errors.
Note 5:
Two on-chip diodes are tied to each analog input, which will forward-conduct for analog input voltages one diode drop below ground or one diode drop
greater than V
CC
supply. Be careful during testing at low V
CC
levels (4.5V), as high level analog inputs (5V) can cause this input diode to conduct, especially at
elevated temperatures, and cause errors for analog inputs near full-scale. The spec allows 50 mV forward bias of either diode. This means that as long as the
analog V
IN
does not exceed the supply voltage by more than 50 mV, the output code will be correct. To achieve an absolute 0 V
DC
to 5 V
DC
input voltage range will
therefore require a minimum supply voltage of 4.950 V
DC
over temperature variations, initial tolerance and loading.
Note 6:
Typicals are at 25
§
C and represent most likely parametric norm.
Note 7:
Guaranteed and 100% production tested under worst case condition.
Note 8:
Guaranteed, but not 100% production tested. These limits are not used to calculate outgoing quality levels.
Note 9:
Channel leakage current is measured after the channel selection.
Note 10:
1 count
e
V
REF
/256.
Note 11:
Human body model, 100 pF discharged through a 1.5 k
X
resistor.
Test Circuits
Leakage Current
TL/H/5587–17
D0 Except ‘‘TRI-STATE’’
TL/H/5587–6
4
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相关代理商/技术参数 |
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|---|---|
| ADC0811BCN/A+ | 制造商:未知厂家 制造商全称:未知厂家 功能描述:Analog-to-Digital Converter， 8-Bit |
| ADC0811BCN/B+ | 制造商:未知厂家 制造商全称:未知厂家 功能描述:Analog-to-Digital Converter， 8-Bit |
| ADC0811BCV | 制造商:NSC 制造商全称:National Semiconductor 功能描述:8-Bit Serial I/O A/D Converter With 11-Channel Multiplexer |
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