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参数资料
| 型号： | ADC0858CIV |
| 厂商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分类： | ADC |
| 英文描述： | 8-Bit Analog Data Acquisition and Monitoring Systems |
| 中文描述： | 8-CH 8-BIT SUCCESSIVE APPROXIMATION ADC, SERIAL ACCESS, PQCC20 |
| 封装： | PLASTIC, LCC-20 |
| 文件页数： | 5/36页 |
| 文件大小： | 581K |
| 代理商： | ADC0858CIV |
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AC Electrical Characteristics
(Continued)
The following specifications apply for V
CC
e a
5 V
DC
, V
REF
e a
4.5 V
DC
, AGND
e
DGND
e
0V, f
CLK
e
1 MHz, t
r
e
t
f
e
5 ns unless otherwise specified.
Boldface limits apply for T
A
e
T
J
e
T
MIN
to T
MAX
;
all other limits apply at T
A
e
T
J
e
25
§
C.
Symbol
Parameter
Conditions
Typical
(Note 5)
Limit
(Note 6)
Units
(Limits)
t
1H
, t
0H
Rising Edge of CS to
Data Output Hi-Z
C
e
100 pF, R
e
2k
(See TRI-STATE
Test Circuits)
90
200
ns (Max)
f
OSC
Oscillator Clock Freq.
(Analog Timing)
R
ext
e
3.16 k
X
C
ext
e
170 pF
1
1.4
0.6
MHz (Max)
MHz (Min)
t
EOC
CS to End of
Conversion Delay
OSC Clock
Periods
Min
Max
1
2
t
Conv
Conversion Time
OSC Clock
Periods
(Min)
(Max)
17
18
t
CS-INT
CS to Interrupt Delay
60
120
ns (Max)
C
IN
Capacitance of
Logic Input
5
pF
C
OUT
Capacitance of
Logic Output
5
pF
Note 1:
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed
specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test
conditions.
Note 2:
All voltages are measured with respect to ground (AGND
e
DGND
e
0V).
Note 3:
All of the analog and digital input pins are internally diode clamped to the supply pins. Should the applied voltage at any pin exceed the power supply
voltage, the additional absolute value of current at that pin (caused by the forward biasing of the internal diodes) should be limited to 5 mA or less.
Note 4:
Human body model, 100 pF discharged through a 1.5 k
X
resistor.
Note 5:
Typical specifications are at
a
25
§
C and represent the most likely parametric norm.
Note 6:
Tested limits are guaranteed to National’s AOQL (Average Outgoing Quality Level).
Note 7:
Total unadjusted error includes comparator offset, ADC linearity and multiplexer error, and, is expressed in LSBs.
Note 8:
Two on-chip diodes are tied to each analog input. The diodes will forward conduct for analog input voltages one diode drop below ground or one diode drop
above V
CC
. Care should be exercised when operating the device at low supply voltages (e.g., V
CC
e
4.5V) because high analog inputs (5V) can cause the input
diodes to conduct, especially at elevated temperatures. This will cause errors for analog inputs near full scale. The specification allows 50 mV forward bias of either
clamp diode. Thus as long as V
IN
or V
REF
does not exceed the supply voltage by more than 50 mV, the output code will be correct. To achieve an absolute 0 V
DC
to 5 V
DC
input voltage range will therefore require a minimum supply voltage of 4.950 V
DC
.
Note 9:
Leakage current is measured with the oscillator clock disabled.
Note 10:
Measured supply current does not include the DAC ladder current.
Note 11:
A 40% to 60% clock duty cycle range ensures proper operation at all clock frequencies.
5
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