参数资料
| 型号： | ADL5315-EVAL |
| 厂商： | Analog Devices Inc |
| 文件页数： | 14/20页 |
| 文件大小： | 0K |
| 描述： | BOARD EVAL FOR ADL5315 |
| 设计资源： | Interfacing ADL5315 to Translinear Logarithmic Amplifier (CN0056) |
| 标准包装： | 1 |
| 主要目的： | 电源管理，电流镜像 |
| 嵌入式： | 否 |
| 已用 IC / 零件： | ADL5315 |
| 主要属性： | 电流镜像，高端，3nA ~ 3mA |
| 次要属性： | 2.7 ~ 8 V 1% 线性可调式输入电流限制 |
| 已供物品： | 板 |
| 相关产品： | ADL5315ACPZ-R7DKR-ND - IC CURRENT MONITOR 8LFCSP ADL5315ACPZ-R7CT-ND - IC CURRENT MONITOR 8LFCSP ADL5315ACPZ-R7TR-ND - IC CURRENT MONITOR 8LFCSP |
ADL5315
2.2
2.0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
CHARACTERIZATION METHODS
During characterization, the ADL5315 was treated as a
precision 1:1 current mirror. To make accurate measurements
throughout the six-decade current range, calibrated Keithley
236 current sources were used to create and measure the test
currents. Measurements at low currents are very susceptible to
leakage to the ground plane. To minimize leakage on the
characterization board, the VSET pin is connected to traces that
buffer V INPT from ground. These traces are connected to the
triax guard connector to provide buffering along the cabling.
0
100p
1n
10n
100n
1 μ
10 μ
100 μ
1m
10m
The primary characterization setup shown in Figure 30 is used
to perform all static measurements, including mirror linearity
2.2
2.0
1.8
1.6
I INPT (A)
Figure 28. V SET Voltage vs. I INPT when
RLIM Is Configured for Automatic Photodiode Biasing
between I INPT and I OUT , V INPT variation vs. I INPT , supply current, and
I INPT current limiting. Component selection of the characterization
board is similar to that of the evaluation board, except that triax
connectors are used instead of SMA. To measure pulse response,
noise, and small signal bandwidth, more specialized test setups
are used.
1.4
ADL5315
INPT
KEITHLEY 236
1.2
CHARACTERIZATION BOARD
1.0
0.8
0.6
IOUT
VPOS VSET SREF COMM
KEITHLEY 236
0.4
0.2
0
DC SUPPLIES/DMM
Figure 30. Primary Characterization Setup
0 1 2 3 4 5 6 7 8 9
I INPT (mA)
Figure 29. V SET Voltage vs. I INPT when
RLIM Is Configured for Automatic Photodiode Biasing
10
The setup in Figure 31 is used to measure the output current
noise of the ADL5315. Batteries are used in numerous places to
minimize introduced noise and remove the uncertainty
resulting from the use of multiple dc supplies. In application,
low value for small input currents to minimize dark current.
The V SET voltage increases in a linear manner at the higher input
currents to maintain accurate photodiode responsivity. The
minimum bias level for the configuration above is ~200 mV.
properly bypassed dc supplies provide similar results. The load
resistor is chosen for each current to maximize signal-to-noise
ratio while maintaining measurement system bandwidth (when
combined with the low capacitance JFET buffer). The custom
LNA is used to overcome noise floor limitations in the
HP89410A signal analyzer.
Rev. 0 | Page 14 of 20
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相关代理商/技术参数 |
参数描述 |
|---|---|
| ADL5317 | 制造商:AD 制造商全称:Analog Devices 功能描述:Avalanche Photodiode Bias Controller and Wide Range (5 nA to 5 mA) Current Monitor |
| ADL5317ACPZ-REEL7 | 功能描述:IC CURRENT MONITOR 16LFCSP RoHS:是 类别:集成电路 (IC) >> PMIC - 稳流/电流管理 系列:- 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:50 系列:- 功能:电流开关 检测方法:- 精确度:±10% 输入电压:1.7 V ~ 5.5 V 电流 - 输出:600mA 工作温度:-40°C ~ 125°C 安装类型:表面贴装 封装/外壳:10-UFQFN 供应商设备封装:10-UTQFN（1.4x1.8） 包装:管件 |
| ADL5317ACPZ-WP | 制造商:Analog Devices 功能描述:SP Amp LOG Amp Single 6V/80V 16-Pin LFCSP EP Tray 制造商:Analog Devices 功能描述:SP AMP LOG AMP SGL 6V/80V 16LFCSP EP - Bulk |
| ADL5317-EVAL | 制造商:Analog Devices 功能描述:EVAL BD FOR AVALANCHE PHOTODIODE BIAS CNTRLR AND WIDE RANGE - Bulk |
| ADL531A-53M0 | 制造商:Panasonic Industrial Company 功能描述:VALVE |
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