参数资料
型号: ADM1027ARQZ-RL7
厂商: ON Semiconductor
文件页数: 14/56页
文件大小: 1822K
描述: IC REMOTE THERMAL CTLR 24QSOP
产品变化通告: MFG CHG Notification ADI to ON Semi
Product Discontinuation Notice 25/Aug/2008
Product Obsolescence 30/Sept/2009
标准包装: 1,000
系列: dBCool®
功能: 风扇控制,温度监控器
传感器类型: 内部和外部
感应温度: 0°C ~ 105°C,外部传感器
精确度: ±1°C
拓扑: ADC,比较器,风扇速度计数器,多路复用器,寄存器库
输出类型: SMBus?
输出警报:
输出风扇:
电源电压: 3 V ~ 5.5 V
工作温度: 0°C ~ 105°C
安装类型: 表面贴装
封装/外壳: 24-SSOP(0.154",3.90mm 宽)
供应商设备封装: 24-QSOP
包装: 带卷 (TR)
REV. A
14
ADM1027
TEMPERATURE MEASUREMENT SYSTEM
Local Temperature Measurement
The ADM1027 contains an on-chip band gap temperature
sensor whose output is digitized by the on-chip 10-bit ADC.
The 8-bit MSB temperature data is stored in the local temp
register (Address 0x26). As both positive and negative tempera-
tures can be measured, the temperature data is stored in twos
complement format, as shown in Table III. Theoretically, the
temperature sensor and ADC can measure temperatures from
128
o
C to +127
o
C with a resolution of 0.25
o
C. However, this
exceeds the operating temperature range of the device (0
o
C to
105
o
C), so local temperature measurements outside this range
are not possible. Temperature measurement from 127
o
C to
+127
o
C is possible using a remote sensor.
Remote Temperature Measurement
The ADM1027 can measure the temperature of two remote
diode sensors or diode-connected transistors connected to
Pins 15 and 16, or 17 and 18.
The forward voltage of a diode or diode-connected transistor,
operated at a constant current, exhibits a negative temperature
coefficient of about 2 mV/
o
C. Unfortunately, the absolute
value of V
be
 varies from device to device, and individual calibra-
tion is required to null this out, so the technique is unsuitable
for mass production. The technique used in the ADM1027 is to
measure the change in V
be
 when the device is operated at two
different currents. This is given by
where:
K is Boltzmanns constant.
q is charge on the carrier.
T is absolute temperature in kelvins.
N is the ratio of the two currents.
Figure 13 shows the input signal conditioning used to measure
the output of a remote temperature sensor. This figure shows the
external sensor as a substrate transistor, provided for temperature
monitoring on some microprocessors. It could equally well be a
discrete transistor such as a 2N3904/06.
D+
D
REMOTE
SENSING
TRANSISTOR
I
N I
I
BIAS
V
DD
V
OUT+
TO ADC
V
OUT
BIAS
DIODE
LOW-PASS
FILTER
f
C
 = 65kHz
THERMDA
THERMDC
CPU
Figure 13. Signal Conditioning for Remote Diode Temperature Sensors
 
 
DV
KT  q
N
be
=
?/DIV>
(  )
ln
Rev. 3 | Page 14 of 56 | www.onsemi.com
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