- 您现在的位置：买卖IC网 > PDF目录375258 > ADM14196E (Analog Devices, Inc.) RS-232 Line Drivers/Receivers(±15kV ESD保护,RS-232线驱动器/接收器) PDF资料下载
参数资料
| 型号： | ADM14196E |
| 厂商： | Analog Devices, Inc. |
| 英文描述： | RS-232 Line Drivers/Receivers(±15kV ESD保护,RS-232线驱动器/接收器) |
| 中文描述： | RS - 232线驱动器/接收器（± 15kV的ESD保护和RS - 232线驱动器/接收器） |
| 文件页数： | 9/13页 |
| 文件大小： | 339K |
| 代理商： | ADM14196E |
REV. 0
9
ADM14196E
PRELIMINARY
DEVICE
UNDER TEST
TECHNICAL
R2
Although very little energy is contained within an ESD pulse,
the extremely fast rise time coupled with high voltages can cause
failures in unprotected semiconductors. Catastrophic destruction
can occur immediately as a result of arcing or heating. Even if
catastrophic failure does not occur immediately, the device may
suffer from parametric degradation which may result in degraded
performance. The cumulative effects of continuous exposure can
eventually lead to complete failure.
I-O lines are particularly vulnerable to ESD damage. Simply
touching or plugging in an I-O cable can result in a static dis-
charge which can damage or completely destroy the interface
product connected to the I-O port. Traditional ESD test meth-
ods such as the MIL-STD-883B method 3015.7 do not fully test
a products susceptibility to this type of discharge. This test was
intended to test a products susceptibility to ESD damage during
handling. Each pin is tested with respect to all other pins. There
are some important differences between the traditional test and
the IEC test:
(a) The IEC test is much more stringent in terms of discharge
energy. The peak current injected is over four times greater.
(b) The current rise time is significantly faster in the IEC test.
(c) The IEC test is carried out while power is applied to the device.
It is possible that the ESD discharge could induce latch-up in the
device under test. This test therefore is more representative of a real-
world I-O discharge where the equipment is operating normally with
power applied. For maximum peace of mind however, both tests
should be performed, therefore, ensuring maximum protection both
during handling and later during field service.
R1
C1
HIGH
VOLTAGE
GENERATOR
ESD TEST METHOD
R2
C1
H. BODY MIL-STD883B
1.5k
100pF
IEC1000-4-2
330
150pF
Figure 21. ESD Test Standards
100
I
P
90
36.8
10
t
DL
t
RL
TIME t
Figure 22. Human Body Model ESD Current Waveform
100
I
P
90
10
TIME t
30ns
60ns
0.1 TO
1ns
Figure 23. IEC1000-4-2 ESD Current Waveform
The ADM14196E is tested using both the above mentioned test
the MIL-STD-883B specification. In addition all I-O pins are
tested as per the IEC test specification. The products were tested
under the following conditions:
(a) Power-OnNormal Operation
(b) Power-Off
There are four levels of compliance defined by IEC1000-
4-2. The ADM14196E meets the most stringent compliance level
for both contact and for air-gap discharge. This means that the
products are able to withstand contact discharges in excess of 8 kV
and air-gap discharges in excess of 15 kV.
Table IV. IEC1000-4-2 Compliance Levels
Level
Contact Discharge
kV
2
4
6
8
Air Discharge
kV
2
4
8
15
1
2
3
4
Table V. ADM14196E ESD Test Results
ESD Test Method
I-O Pins
Other Pins
MIL-STD-883B
IEC1000-4-2
Contact
Air
±15 kV
±2.5 kV
±8 kV
±15 kV
FAST TRANSIENT BURST TESTING (IEC1000-4-4)
IEC1000-4-4 (previously 801-4) covers electrical fast-
transient/burst (EFT) immunity. Electrical fast transients
occur as a result of arcing contacts in switches and relays.
The tests simulate the interference generated when for
example a power relay disconnects an inductive load. A
spark is generated due to the well known back EMF
effect. In fact the spark consists of a burst of sparks as the relay
contacts separate. The voltage appearing on the line, therefore,
consists of a bust of extremely fast transient impulses. A similar
effect occurs when switching on fluorescent lights.
The fast transient burst test defined in IEC1000-4-4 simulates
相关PDF资料 |
PDF描述 |
|---|---|
| ADM208E | RS-232 Line Drivers/Receivers(15kV ESD保护,RS-232线驱动器/接收器) |
| ADM209 | +5 V Powered CMOS RS-232 Drivers/Receivers(CMOS RS-232驱动器/接收器) |
| ADM213 | +5 V Powered CMOS RS-232 Drivers/Receivers(CMOS RS-232驱动器/接收器) |
| ADM223 | High Speed, CMOS RS-232 Drivers/Receivers(CMOS RS-232驱动器/接收器) |
| ADM230L | High Speed, CMOS RS-232 Drivers/Receivers(CMOS RS-232驱动器/接收器) |
相关代理商/技术参数 |
参数描述 |
|---|---|
| ADM1485 | 制造商:AD 制造商全称:Analog Devices 功能描述:+-5 V Low Power EIA RS-485 Transceiver |
| ADM1485_12 | 制造商:AD 制造商全称:Analog Devices 功能描述:5 V Low Power EIA RS-485 Transceiver |
| ADM1485AN | 制造商:Analog Devices 功能描述:Single Transmitter/Receiver RS-422/RS-485 8-Pin PDIP 制造商:Rochester Electronics LLC 功能描述:RS-485 HIGH SPEED I/F TX. - Bulk 制造商:Analog Devices 功能描述:Transceiver IC Transceiver Type:Differen |
| ADM1485ANZ | 功能描述:IC TXRX RS-485 HS 5V 8-DIP RoHS:是 类别:集成电路 (IC) >> 接口 - 驱动器，接收器，收发器 系列:- 产品培训模块:RS-232 & USB Transceiver 标准包装:2,000 系列:- 类型:收发器 驱动器/接收器数:1/1 规程:RS232 电源电压:3 V ~ 5.5 V 安装类型:表面贴装 封装/外壳:16-SSOP（0.209"，5.30mm 宽） 供应商设备封装:16-SSOP 包装:带卷 (TR) 其它名称:296-19849-2 |
| ADM1485AQ | 制造商:AD 制造商全称:Analog Devices 功能描述:+-5 V Low Power EIA RS-485 Transceiver |
发布紧急采购，3分钟左右您将得到回复。