参数资料
型号: ADS7883SDBVT
厂商: Texas Instruments
文件页数: 12/19页
文件大小: 0K
描述: IC ADC 12BIT 3MSPS SOT23-6
产品培训模块: Data Converter Basics
标准包装: 1
位数: 12
采样率(每秒): 3M
数据接口: 串行
转换器数目: 1
功率耗散(最大): 20mW
电压电源: 单电源
工作温度: -40°C ~ 125°C
安装类型: 表面贴装
封装/外壳: SOT-23-6
供应商设备封装: SOT-23-6
包装: 标准包装
输入数目和类型: 1 个单端,单极
产品目录页面: 892 (CN2011-ZH PDF)
其它名称: 296-23635-6
SCLK
+IN
VDD
CDAC
SAR
COMPARATOR
OUTPUT
LATCHES
&
3STATE
DRIVERS
CONVERSION
&
CONTROL
LOGIC
SDO
CS
ABSOLUTE MAXIMUM RATINGS
(1)
SLAS594 – JULY 2008 ....................................................................................................................................................................................................... www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
PACKAGE/ORDERING INFORMATION(1)
MAXIMUM
NO MISSING
PACKAGE
TRANSPORT
INTEGRAL
DIFFERENTIAL
CODES AT
PACKAGE
TEMPERATURE
PACKAGE
ORDERING
DEVICE
DESIGNAT
MEDIA
LINEARITY
RESOLUTION
TYPE
RANGE
MARKING
INFORMATION
OR
QUANTITY
(LSB)
(BIT)
Small Tape and
7883
ADS7883SBDBVT
Reel 250
ADS7883SB
±1
12
Large Tape and
7883
ADS7883SBDBVR
Reel 3000
6-Pin
DBV
–40°C to 125°C
SOT23
Small Tape and
7883
ADS7883SDBVT
Reel 250
ADS7883S
±2
11
Large Tape and
7883
ADS7883SDBVR
Reel 3000
(1)
For most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
UNIT
+IN to AGND
–0.3 V to +VDD +0.3 V
+VDD to AGND
–0.3 V to 7.0 V
Digital input voltage to GND
–0.3 V to (7.0 V)
Digital output to GND
–0.3 V to (+VDD + 0.3 V)
Operating temperature range
–40°C to 125°C
Storage temperature range
–65°C to 150°C
Junction temperature (TJ Max)
150°C
Power dissipation, SOT23 package
(TJ Max–TA)/θJA
Thermal impedance,
θ
JA
SOT23
295.2°C/W
Vapor phase (60 sec)
215°C
Lead temperature, soldering
Infrared (15 sec)
220°C
(1)
Stresses above those listed under absolute maximum ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
2
Copyright 2008, Texas Instruments Incorporated
Product Folder Link(s): ADS7883
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